Non-contact imaging with enhanced spatial resolution by secondary electron detection

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F10%3A00225784" target="_blank" >RIV/68407700:21670/10:00225784 - isvavai.cz</a>

Výsledek na webu

<a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5873803" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5873803</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/NSSMIC.2010.5873803" target="_blank" >10.1109/NSSMIC.2010.5873803</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Non-contact imaging with enhanced spatial resolution by secondary electron detection

Popis výsledku v původním jazyce

The Neutron Activation Analysis is a very sensitive method for determination of element content and composition. However, conventional methods do not provide information regarding the spatial distribution of the elements in the sample. To fulfill this need, we developed an electron imaging device with electron optics which provides element spatial distribution information based on beta-gamma coincidence. The investigated element is identified by the characteristic gamma radiation while the spatial information is obtained by the position sensitive detection of ?-decay electrons. Unlike common and often invasive approaches our non-destructive method provides imaging and analysis simultaneously. This system makes use of tailor-made electron optics to select and focus coincidence electrons providing higher spatial resolution and better contrast images. For this purpose the semiconductor pixel detector Timepix is used for electron detection and is triggered by a gamma detector. In this cont

Název v anglickém jazyce

Non-contact imaging with enhanced spatial resolution by secondary electron detection

Popis výsledku anglicky

The Neutron Activation Analysis is a very sensitive method for determination of element content and composition. However, conventional methods do not provide information regarding the spatial distribution of the elements in the sample. To fulfill this need, we developed an electron imaging device with electron optics which provides element spatial distribution information based on beta-gamma coincidence. The investigated element is identified by the characteristic gamma radiation while the spatial information is obtained by the position sensitive detection of ?-decay electrons. Unlike common and often invasive approaches our non-destructive method provides imaging and analysis simultaneously. This system makes use of tailor-made electron optics to select and focus coincidence electrons providing higher spatial resolution and better contrast images. For this purpose the semiconductor pixel detector Timepix is used for electron detection and is triggered by a gamma detector. In this cont

Druh

D - Stať ve sborníku

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

2010 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)

ISBN

978-1-4244-9106-3

ISSN

1095-7863

e-ISSN

—

Počet stran výsledku

2

Strana od-do

462-463

Název nakladatele

IEEE

Místo vydání

Piscataway (New Jersey)

Místo konání akce

Knoxville (Tennessee)

Datum konání akce

30. 10. 2010

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000306402900098