Combined Medipix based imaging system with Si and CdTe sensor

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F11%3A00203753" target="_blank" >RIV/68407700:21670/11:00203753 - isvavai.cz</a>

Výsledek na webu

<a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6154710" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6154710</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/NSSMIC.2011.6154710" target="_blank" >10.1109/NSSMIC.2011.6154710</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Combined Medipix based imaging system with Si and CdTe sensor

Popis výsledku v původním jazyce

Medipix family detectors prove to be excellent tools for many different applications including the field of X-ray imaging. One of the main advantages of these devices is that the hybrid nature of the Medipix2 device allows using the same readout chip with different sensor materials (Si, GaAs, CdTe...). The idea presented in this work is to arrange the stack of two Medipix2 devices equipped with the Si (0.3 mm thick) and CdTe (1 mm thick) sensors to use the advantage of both materials for X-ray imaging during single exposure. Top Si layer is used to measure low energy X-rays benefiting from the excellent sensor material homogeneity. Bottom CdTe layer is used for measuring X-ray photons with higher energies taking the advantage of much higher detection efficiency of CdTe material in this part of incident spectra. By combining information from both sensitive layers it is possible to obtain high contrast, high spatial resolution images and also opens up the possibility to evaluate the samp

Název v anglickém jazyce

Combined Medipix based imaging system with Si and CdTe sensor

Popis výsledku anglicky

Medipix family detectors prove to be excellent tools for many different applications including the field of X-ray imaging. One of the main advantages of these devices is that the hybrid nature of the Medipix2 device allows using the same readout chip with different sensor materials (Si, GaAs, CdTe...). The idea presented in this work is to arrange the stack of two Medipix2 devices equipped with the Si (0.3 mm thick) and CdTe (1 mm thick) sensors to use the advantage of both materials for X-ray imaging during single exposure. Top Si layer is used to measure low energy X-rays benefiting from the excellent sensor material homogeneity. Bottom CdTe layer is used for measuring X-ray photons with higher energies taking the advantage of much higher detection efficiency of CdTe material in this part of incident spectra. By combining information from both sensitive layers it is possible to obtain high contrast, high spatial resolution images and also opens up the possibility to evaluate the samp

Druh

D - Stať ve sborníku

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

IEEE Nuclear Science Symposium and Medical Imaging Conference 2011

ISBN

978-1-4673-0118-3

ISSN

1082-3654

e-ISSN

—

Počet stran výsledku

5

Strana od-do

4761-4765

Název nakladatele

Omnipress

Místo vydání

Piscataway, New Jersey

Místo konání akce

Valencia

Datum konání akce

23. 10. 2011

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000304755604204