Energy loss and online directional track visualization of fast electrons with the pixel detector Timepix

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F13%3A00215977" target="_blank" >RIV/68407700:21670/13:00215977 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61389005:_____/13:00424873

Výsledek na webu

<a href="http://www.utef.cvut.cz/cz/index.php?Ns=202&sid=1029&id=1000479" target="_blank" >http://www.utef.cvut.cz/cz/index.php?Ns=202&sid=1029&id=1000479</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.radmeas.2013.07.006" target="_blank" >10.1016/j.radmeas.2013.07.006</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Energy loss and online directional track visualization of fast electrons with the pixel detector Timepix

Popis výsledku v původním jazyce

The spectral-, position- and tracking-response of Timepix to energetic electrons has been tested and characterized with well-defined low-intensity parallel beams of monoenergetic electrons in the 7 e21 MeV range. The per-pixel energy sensitivity of Timepix serves as a position-sensitive dE/dx detector to determine the energy loss over along the particle track. The sampling path pitch can be set to 55 mm (pixel-size) and arbitrary values between 300 mm (sensor thickness) and nearly 2 mm. Timepix can register and visualize not only the position and trajectories but also the direction of trajectories and the rate of directional scattering of single fast electrons across the semiconductor sensor. The technique serves to measure the spatial distribution ofa parallel beam, the beam size spread, transversal beam flux homogeneity and lateral straggling at the pixel-size scale. The mean scattering path along the beam axis and the mean path for lateral beam straggling in silicon can be determin

Název v anglickém jazyce

Energy loss and online directional track visualization of fast electrons with the pixel detector Timepix

Popis výsledku anglicky

The spectral-, position- and tracking-response of Timepix to energetic electrons has been tested and characterized with well-defined low-intensity parallel beams of monoenergetic electrons in the 7 e21 MeV range. The per-pixel energy sensitivity of Timepix serves as a position-sensitive dE/dx detector to determine the energy loss over along the particle track. The sampling path pitch can be set to 55 mm (pixel-size) and arbitrary values between 300 mm (sensor thickness) and nearly 2 mm. Timepix can register and visualize not only the position and trajectories but also the direction of trajectories and the rate of directional scattering of single fast electrons across the semiconductor sensor. The technique serves to measure the spatial distribution ofa parallel beam, the beam size spread, transversal beam flux homogeneity and lateral straggling at the pixel-size scale. The mean scattering path along the beam axis and the mean path for lateral beam straggling in silicon can be determin

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JV - Kosmické technologie

OECD FORD obor

—

Projekt

<a href="/cs/project/LC07050" target="_blank" >LC07050: Centrum experimentální jaderné astrofyziky a jaderné fyziky</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Radiation Measurements

ISSN

1350-4487

e-ISSN

—

Svazek periodika

—

Číslo periodika v rámci svazku

59

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

17

Strana od-do

245-261

Kód UT WoS článku

000329421700039

EID výsledku v databázi Scopus

—