Ionizing Energy Depositions After Fast Neutron Interactions in Silicon

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F16%3A00302434" target="_blank" >RIV/68407700:21670/16:00302434 - isvavai.cz</a>

Výsledek na webu

<a href="http://ieeexplore.ieee.org/document/7482701/" target="_blank" >http://ieeexplore.ieee.org/document/7482701/</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/TNS.2016.2574961" target="_blank" >10.1109/TNS.2016.2574961</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Ionizing Energy Depositions After Fast Neutron Interactions in Silicon

Popis výsledku v původním jazyce

In this study we present the ionizing energy depositions in a 300 μm thick silicon layer after fast neutron impact. With the Time-of-Flight (ToF) technique, the ionizing energy deposition spectra of recoil silicons and secondary charged particles were assigned to (quasi-)monoenergetic neutron energies in the range from 180 keV to hundreds of MeV. We show and interpret representative measured energy spectra. By separating the ionizing energy losses of the recoil silicon from energy depositions by products of nuclear reactions, the competition of ionizing (IEL) and non-ionizing energy losses (NIEL) of a recoil silicon within the silicon lattice was investigated. The data give supplementary information to the results of a previous measurement and are compared with different theoretical predictions.

Název v anglickém jazyce

Ionizing Energy Depositions After Fast Neutron Interactions in Silicon

Popis výsledku anglicky

In this study we present the ionizing energy depositions in a 300 μm thick silicon layer after fast neutron impact. With the Time-of-Flight (ToF) technique, the ionizing energy deposition spectra of recoil silicons and secondary charged particles were assigned to (quasi-)monoenergetic neutron energies in the range from 180 keV to hundreds of MeV. We show and interpret representative measured energy spectra. By separating the ionizing energy losses of the recoil silicon from energy depositions by products of nuclear reactions, the competition of ionizing (IEL) and non-ionizing energy losses (NIEL) of a recoil silicon within the silicon lattice was investigated. The data give supplementary information to the results of a previous measurement and are compared with different theoretical predictions.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

—

Projekt

—

Návaznosti

R - Projekt Ramcoveho programu EK

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

IEEE Transactions on Nuclear Science

ISSN

0018-9499

e-ISSN

—

Svazek periodika

63

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

7

Strana od-do

2372-2378

Kód UT WoS článku

000382469200015

EID výsledku v databázi Scopus

2-s2.0-84984677464