Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A90107%2F22%3A00363777" target="_blank" >RIV/68407700:90107/22:00363777 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1103/PhysRevD.106.092001" target="_blank" >https://doi.org/10.1103/PhysRevD.106.092001</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1103/PhysRevD.106.092001" target="_blank" >10.1103/PhysRevD.106.092001</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection

Popis výsledku v původním jazyce

Experiments aiming to directly detect dark matter through particle recoils can achieve energy thresholds of Oo10 eV thorn . In this regime, ionization signals from small-angle Compton scatters of environmental gamma rays constitute a significant background. Monte Carlo simulations used to build background models have not been experimentally validated at these low energies. We report a precision measurement of Compton scattering on silicon atomic shell electrons down to 23 eV. A skipper charge-coupled device with single -electron resolution, developed for the DAMIC-M experiment, was exposed to a 241Am gamma-ray source over several months. Features associated with the silicon K-, L1-, and L2;3-shells are clearly identified, and scattering on valence electrons is detected for the first time below 100 eV. We find that the relativistic impulse approximation for Compton scattering, which is implemented in Monte Carlo simulations commonly used by direct detection experiments, does not reproduce the measured spectrum below 0.5 keV. The data are in better agreement with ab initio calculations originally developed for x-ray absorption spectroscopy.

Název v anglickém jazyce

Precision measurement of Compton scattering in silicon with a skipper CCD for dark matter detection

Popis výsledku anglicky

Experiments aiming to directly detect dark matter through particle recoils can achieve energy thresholds of Oo10 eV thorn . In this regime, ionization signals from small-angle Compton scatters of environmental gamma rays constitute a significant background. Monte Carlo simulations used to build background models have not been experimentally validated at these low energies. We report a precision measurement of Compton scattering on silicon atomic shell electrons down to 23 eV. A skipper charge-coupled device with single -electron resolution, developed for the DAMIC-M experiment, was exposed to a 241Am gamma-ray source over several months. Features associated with the silicon K-, L1-, and L2;3-shells are clearly identified, and scattering on valence electrons is detected for the first time below 100 eV. We find that the relativistic impulse approximation for Compton scattering, which is implemented in Monte Carlo simulations commonly used by direct detection experiments, does not reproduce the measured spectrum below 0.5 keV. The data are in better agreement with ab initio calculations originally developed for x-ray absorption spectroscopy.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

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OECD FORD obor

10304 - Nuclear physics

Projekt

—

Návaznosti

—

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Physical Review D

ISSN

2470-0010

e-ISSN

2470-0029

Svazek periodika

106

Číslo periodika v rámci svazku

9

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

12

Strana od-do

"092001-1"-"092001-12"

Kód UT WoS článku

000886709000009

EID výsledku v databázi Scopus

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