The counterfeit components V-I characteristics difference study

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F70883521%3A28140%2F12%3A43869026" target="_blank" >RIV/70883521:28140/12:43869026 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

The counterfeit components V-I characteristics difference study

Popis výsledku v původním jazyce

The electronic component V-I characteristics express a relationship between the current flowing via a chosen couple of pins, and the voltage applied on those pins. That voltage varies between two safe, for the component health limits, during the V-I characteristic recording. The applied voltage variation follows a certain function like sinus or ramp. The V-I characteristics of an individual component type can differ according to production technology, according to a particular manufacturer, or accordingto measurement conditions itself. Those so called natural differences can be registered by the study of statistically significant component population with known origin and history, and they can be subsumed in the comparison master pin print. That comparison master pin print is subsequently used as a criterion for discovering differences caused by improper treatment, failure or by the counterfeiting process. The article illustrates a counterfeit detector application for comparative V-I

Název v anglickém jazyce

The counterfeit components V-I characteristics difference study

Popis výsledku anglicky

The electronic component V-I characteristics express a relationship between the current flowing via a chosen couple of pins, and the voltage applied on those pins. That voltage varies between two safe, for the component health limits, during the V-I characteristic recording. The applied voltage variation follows a certain function like sinus or ramp. The V-I characteristics of an individual component type can differ according to production technology, according to a particular manufacturer, or accordingto measurement conditions itself. Those so called natural differences can be registered by the study of statistically significant component population with known origin and history, and they can be subsumed in the comparison master pin print. That comparison master pin print is subsequently used as a criterion for discovering differences caused by improper treatment, failure or by the counterfeiting process. The article illustrates a counterfeit detector application for comparative V-I

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/ED2.1.00%2F03.0089" target="_blank" >ED2.1.00/03.0089: Centrum bezpečnostních, informačních a pokročilých technologií (CEBIA-Tech)</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

WSEAS Transactions on Circuits and Systems

ISSN

1109-2734

e-ISSN

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Svazek periodika

11

Číslo periodika v rámci svazku

8

Stát vydavatele periodika

GR - Řecká republika

Počet stran výsledku

13

Strana od-do

259-271

Kód UT WoS článku

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EID výsledku v databázi Scopus

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