Measuring and simulation of Point Spread Function as a basic property of an optical device

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Measuring and simulation of Point Spread Function as a basic property of an optical device

Popis výsledku v původním jazyce

None of optical devices is perfect. Each lens has some errors, e.g. tilt, coma, spherical or chromatic aberration. The more lenses are in the optical device the more errors can reveal. All these imperfection accumulates and multiplies during the path through the optical device. It is necessary to know how the light passes through and interacts with each optical element. There are some possibilities of simulation of these defects. One of these methods is ENZ (Extended Nijboer-Zernike) theory which can be set up for different light condition and different aberration. There is also possibility to measure this property. As will be shown in this article I made this experiment using microscope and microscopic objects as an example of optical device with more lenses and optical elements. Measurements in combination with image analysis (entropy calculation) and 3D reconstruction give us overview of distortions which undergoes the original image. Results of both methods simulation and measurements can be used for improving of the original image. If we know how the image is distorted the knowledge of PSF (Point Spread Function) can help us to remove this distortion and obtain better image. This can be done using deconvolution function and the known PSF as a kernel for this function. Using simulations and PSF measurements can also help to improve resolution of the image and reveal more details. This can be helpful in many different fields, for example in biology, astronomy or in analysis of satellites or aerial photos.

Název v anglickém jazyce

Measuring and simulation of Point Spread Function as a basic property of an optical device

Popis výsledku anglicky

None of optical devices is perfect. Each lens has some errors, e.g. tilt, coma, spherical or chromatic aberration. The more lenses are in the optical device the more errors can reveal. All these imperfection accumulates and multiplies during the path through the optical device. It is necessary to know how the light passes through and interacts with each optical element. There are some possibilities of simulation of these defects. One of these methods is ENZ (Extended Nijboer-Zernike) theory which can be set up for different light condition and different aberration. There is also possibility to measure this property. As will be shown in this article I made this experiment using microscope and microscopic objects as an example of optical device with more lenses and optical elements. Measurements in combination with image analysis (entropy calculation) and 3D reconstruction give us overview of distortions which undergoes the original image. Results of both methods simulation and measurements can be used for improving of the original image. If we know how the image is distorted the knowledge of PSF (Point Spread Function) can help us to remove this distortion and obtain better image. This can be done using deconvolution function and the known PSF as a kernel for this function. Using simulations and PSF measurements can also help to improve resolution of the image and reveal more details. This can be helpful in many different fields, for example in biology, astronomy or in analysis of satellites or aerial photos.

Druh

D - Stať ve sborníku

CEP obor

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OECD FORD obor

10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Projekt

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Návaznosti

V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

17th international Multidisciplinary Scientific Geoconference SGEM 2017 Conference Proceedings Volume 17 - Informatics, Geoinformatics and Remote Sensing Issue 21

ISBN

9786197408010

ISSN

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e-ISSN

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Počet stran výsledku

8

Strana od-do

409-416

Název nakladatele

STEF92 TECHNOLOGY LTD

Místo vydání

Sofia (Bulharsko)

Místo konání akce

Albena (Bulharsko)

Datum konání akce

29. 6. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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