Filtry
Optical Element for X-ray Microscopy
We present a proposal for an X-ray optical element suitable for X-ray microscopy and other X-ray-based optical systems. Its principle is based on the Fresnel lenses condition and the Bragg condition for X-ray
BH - Optika, masery a lasery
- 2011 •
- Jx •
- Odkaz
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Soft X-ray microscopy beamline for the CESLAB
The article is focused to the use of soft x-ray microscopy for 3D analysis of cellular structures.
BO - Biofyzika
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Correlation of X-ray Computed Nanotomography and Scanning Electron Microscopy Imaging of Collagen Scaffolds
This paper describes means of correlation of measurement of scaffolds by X-ray computed tomography and scanning electron microscopy.
Other biological topics
- 2018 •
- Jost •
- Odkaz
Rok uplatnění
Jost - Ostatní články v recenzovaných periodicích
Výsledek na webu
X-ray laser interference microscopy for advanced studies of laser-induced damages
We show result obtained using XUV interference microscopy to observe in situ nanometer-scale modifications of optical surfaces exposed to intense sub-ns laser pulses....
BH - Optika, masery a lasery
- 2007 •
- D
Rok uplatnění
D - Stať ve sborníku
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies...
BM - Fyzika pevných látek a magnetismus
- 2006 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Proposal of New Optical Elements
A overview of our patented proposals of new optical elements is presented. The elementsare suitable for laser pulse analysis, telescopy, X-ray microscopy and X-ray telescopy. They are based on the interference properties of...
JA - Elektronika a optoelektronika, elektrotechnika
- 2013 •
- Jx •
- Odkaz
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Optical Element for X-ray Microscopy
Presented solution deals with an X-ray optical element suitable in particular for X-ray microscopy and other X-ray-based display systems. Disadvantages of known setups are improved by an optical set-up exploiting a...
BH - Optika, masery a lasery
- 2012 •
- P •
- Odkaz
Rok uplatnění
P - Patent
Výsledek na webu
Microstructure analysis of nanocrystalline materials and nanocomposites using the combiantion of X-ray diffraction and transmission electron microscopy
Microstructure analysis of nanocrystalline materials and nanocomposites using the combiantion of X-ray diffraction and transmission electron microscopy......
BM - Fyzika pevných látek a magnetismus
- 2007 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
X-ray microscopy and imaging oof Caenorhabditis elegans nematode using a laser-plasma-pulsed x-ray source.
An experiment on Soft X-ray Contact Microscopy(SXCM) performed on Caenorhabditis elegans nematodes is discussed.The experiment has been performed using the iodine PALS laser source to generate pulsed soft X-rays from laser-...
BH - Optika, masery a lasery
- 2004 •
- D
Rok uplatnění
D - Stať ve sborníku
Optical Element for X-ray Microscopy
Optical system imaging X-rays of wavelength lambda is composed of monocrystal with atomic layers parallel to optical axis, whose distance changes in direction perpendicular to optical axis by external force....
BH - Optika, masery a lasery
- 2007 •
- X
Rok uplatnění
X - Nezařazeno
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