Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C60

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F11%3A%230000304" target="_blank" >RIV/00177016:_____/11:#0000304 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00177016:_____/11:#0000380

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C60

Popis výsledku v původním jazyce

Nanoscale dimensional measurements are very often focused on small objects formed by only a few atomic layers in one or more dimensions. The classical convolution approach to tip?sample artifacts cannot be, on its own, suf?cient for these specimens due to their quantum-mechanical nature. With growing resolution of specialized metrology scanning probe microscopes and increasing requirements of exact measurements in nanoscale range, it is necessary to make a transition from the classical picture to a quantum approach on the ?eld of uncertainty analysis. In this paper, sources of uncertainty connected with tip?sample relaxation at the atomic level are discussed. Results of density functional theory modeling (using the tight-binding approximation softwareFIREBALL) of AFM scans on fullerenes are presented. In our approach we model the tip apex and the sample as systems of individual atoms.

Název v anglickém jazyce

Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C60

Popis výsledku anglicky

Nanoscale dimensional measurements are very often focused on small objects formed by only a few atomic layers in one or more dimensions. The classical convolution approach to tip?sample artifacts cannot be, on its own, suf?cient for these specimens due to their quantum-mechanical nature. With growing resolution of specialized metrology scanning probe microscopes and increasing requirements of exact measurements in nanoscale range, it is necessary to make a transition from the classical picture to a quantum approach on the ?eld of uncertainty analysis. In this paper, sources of uncertainty connected with tip?sample relaxation at the atomic level are discussed. Results of density functional theory modeling (using the tight-binding approximation softwareFIREBALL) of AFM scans on fullerenes are presented. In our approach we model the tip apex and the sample as systems of individual atoms.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

<a href="/cs/project/KAN311610701" target="_blank" >KAN311610701: Nanometrologie využívající metod rastrovací sondové mikroskopie</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Measurement Science and Technology

ISSN

0957-0233

e-ISSN

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Svazek periodika

22

Číslo periodika v rámci svazku

2011

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

6

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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