Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F09%3A00028548" target="_blank" >RIV/00216224:14310/09:00028548 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00177016:_____/09:#0000358

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

Popis výsledku v původním jazyce

Nanoscale dimensional measurements are very often focused on small objects formed by only a few atomic layers in one or more dimensions. The classical convolution approach to tip-sample artefacts cannot be valid for these specimens due to the quantum-mechanical nature of small objects. As interatomic forces act on the sample and the tip of the microscope, the atoms of both relax in order to reach equilibrium positions. This leads to changes in those quantities that are finally interpreted as the atomicforce microscope (AFM) tip position and influences the resultant dimensional measurements. In this paper, sources of uncertainty connected with tip-surface relaxation at the atomic level are discussed. Results of density functional theory modeling (usingthe tight-binding approximation software Fireball) of AFM scans on typical systems used in nanometrology, e.g., fullerenes and carbon nanotubes, on highly oriented pyrolytic graphite substrates are presented.

Název v anglickém jazyce

Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

Popis výsledku anglicky

Nanoscale dimensional measurements are very often focused on small objects formed by only a few atomic layers in one or more dimensions. The classical convolution approach to tip-sample artefacts cannot be valid for these specimens due to the quantum-mechanical nature of small objects. As interatomic forces act on the sample and the tip of the microscope, the atoms of both relax in order to reach equilibrium positions. This leads to changes in those quantities that are finally interpreted as the atomicforce microscope (AFM) tip position and influences the resultant dimensional measurements. In this paper, sources of uncertainty connected with tip-surface relaxation at the atomic level are discussed. Results of density functional theory modeling (usingthe tight-binding approximation software Fireball) of AFM scans on typical systems used in nanometrology, e.g., fullerenes and carbon nanotubes, on highly oriented pyrolytic graphite substrates are presented.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

<a href="/cs/project/KAN311610701" target="_blank" >KAN311610701: Nanometrologie využívající metod rastrovací sondové mikroskopie</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Measurement Science and Technology

ISSN

0957-0233

e-ISSN

—

Svazek periodika

20

Číslo periodika v rámci svazku

084014

Stát vydavatele periodika

CZ - Česká republika

Počet stran výsledku

6

Strana od-do

—

Kód UT WoS článku

—

EID výsledku v databázi Scopus

—