Quantitative data processing in Scanning Probe Microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F12%3A%230000814" target="_blank" >RIV/00177016:_____/12:#0000814 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00177016:_____/12:#0001049

Výsledek na webu

<a href="http://store.elsevier.com/product.jsp?isbn=9781455730582&pagename=search" target="_blank" >http://store.elsevier.com/product.jsp?isbn=9781455730582&pagename=search</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/B978-1-45-573058-2.00004-8" target="_blank" >10.1016/B978-1-45-573058-2.00004-8</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Quantitative data processing in Scanning Probe Microscopy

Popis výsledku v původním jazyce

Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic ForceMicroscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such asthe complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics,

Název v anglickém jazyce

Quantitative data processing in Scanning Probe Microscopy

Popis výsledku anglicky

Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic ForceMicroscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such asthe complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics,

Druh

B - Odborná kniha

CEP obor

JB - Senzory, čidla, měření a regulace

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

ISBN

978-1-4557-3058-2

Počet stran knihy

336

Název nakladatele

Elsevier

Místo vydání

Oxford

Kód UT WoS knihy

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