Design and Calibration of a Compact Quasi-Optical System for Material Characterization in Millimeter/Submillimeter Wave Domain

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F14%3A%230000906" target="_blank" >RIV/00177016:_____/14:#0000906 - isvavai.cz</a>

Výsledek na webu

<a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6983634" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6983634</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/TIM.2014.2376115" target="_blank" >10.1109/TIM.2014.2376115</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Design and Calibration of a Compact Quasi-Optical System for Material Characterization in Millimeter/Submillimeter Wave Domain

Popis výsledku v původním jazyce

A compact quasi-optical setup based on conventional rectangular horn antennas and two symmetrical parabolic mirrors is designed to provide a plane wave on the material under test. To measure the scattering parameters at millimeter/submillimeter wavelengths, a commercial vector network analyzer and waveguide frequency extension units are used. The calibration of the system is performed with a simple practical deembedding process to determine the S-parameters on the material surface without using high-cost micrometer positioners. A reliable extraction method is presented to derive the material permittivity and calculate the errors and uncertainties as direct functions of the sample and setup geometry and their physical characteristics. Several materialsare measured and the complex permittivity is presented together with a detailed uncertainty budget.

Název v anglickém jazyce

Design and Calibration of a Compact Quasi-Optical System for Material Characterization in Millimeter/Submillimeter Wave Domain

Popis výsledku anglicky

A compact quasi-optical setup based on conventional rectangular horn antennas and two symmetrical parabolic mirrors is designed to provide a plane wave on the material under test. To measure the scattering parameters at millimeter/submillimeter wavelengths, a commercial vector network analyzer and waveguide frequency extension units are used. The calibration of the system is performed with a simple practical deembedding process to determine the S-parameters on the material surface without using high-cost micrometer positioners. A reliable extraction method is presented to derive the material permittivity and calculate the errors and uncertainties as direct functions of the sample and setup geometry and their physical characteristics. Several materialsare measured and the complex permittivity is presented together with a detailed uncertainty budget.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/7AX13009" target="_blank" >7AX13009: Microwave and terahertz metrology for homeland security</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

IEEE Transactions on Instrumentation and Measurement

ISSN

0018-9456

e-ISSN

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Svazek periodika

PP

Číslo periodika v rámci svazku

99

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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