Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F20%3AN0000020" target="_blank" >RIV/00177016:_____/20:N0000020 - isvavai.cz</a>

Výsledek na webu

<a href="https://link.springer.com/article/10.1007/s10762-020-00723-0" target="_blank" >https://link.springer.com/article/10.1007/s10762-020-00723-0</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/s10762-020-00723-0" target="_blank" >10.1007/s10762-020-00723-0</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies

Popis výsledku v původním jazyce

Material parameter extraction algorithms are studied and simplified both for transmission-reflection and transmission-only methods. The simplified relations, which are closed-form in some cases, are analyzed to establish the uncertainty sensitivity coefficients and therefore, to clarify the main uncertainty contributions and reduce the systematic and random errors. Simple closed-form expressions presented in this paper show the sensitivity of the extracted permittivity to each input parameter such as S21 (phase and amplitude), frequency, and the material thickness. Results are presented for several material slabs for three waveguide frequency ranges 75–110 GHz, 140–220 GHz, and 500–750 GHz using VNA-based free-space technique in the THz domain. Comparison of results (and the associated uncertainties) between different algorithms can help to choose the optimal one suitable for lossy or lowloss materials, and thin or thicker slabs. This can explain why the same set of S-parameters data usually gives different final results (permittivity and permeability) with different algorithms and verify the reliability of the calibration and extraction process.

Název v anglickém jazyce

Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies

Popis výsledku anglicky

Material parameter extraction algorithms are studied and simplified both for transmission-reflection and transmission-only methods. The simplified relations, which are closed-form in some cases, are analyzed to establish the uncertainty sensitivity coefficients and therefore, to clarify the main uncertainty contributions and reduce the systematic and random errors. Simple closed-form expressions presented in this paper show the sensitivity of the extracted permittivity to each input parameter such as S21 (phase and amplitude), frequency, and the material thickness. Results are presented for several material slabs for three waveguide frequency ranges 75–110 GHz, 140–220 GHz, and 500–750 GHz using VNA-based free-space technique in the THz domain. Comparison of results (and the associated uncertainties) between different algorithms can help to choose the optimal one suitable for lossy or lowloss materials, and thin or thicker slabs. This can explain why the same set of S-parameters data usually gives different final results (permittivity and permeability) with different algorithms and verify the reliability of the calibration and extraction process.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

R - Projekt Ramcoveho programu EK

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

International Journal of Infrared and Millimeter Waves

ISSN

1866-6892

e-ISSN

1866-6906

Svazek periodika

41

Číslo periodika v rámci svazku

10

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

19

Strana od-do

1199-1217

Kód UT WoS článku

000552186700001

EID výsledku v databázi Scopus

2-s2.0-85088569266