Porous Silicon Nanowires: Evaluation of Thermal Properties By a Vamas Interlaboratory Comparison on Scanning Thermal Microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F24%3AN0000145" target="_blank" >RIV/00177016:_____/24:N0000145 - isvavai.cz</a>

Výsledek na webu

<a href="https://iopscience.iop.org/article/10.1149/MA2024-02131581mtgabs" target="_blank" >https://iopscience.iop.org/article/10.1149/MA2024-02131581mtgabs</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Porous Silicon Nanowires: Evaluation of Thermal Properties By a Vamas Interlaboratory Comparison on Scanning Thermal Microscopy

Popis výsledku v původním jazyce

The Versailles Project on Advanced Materials and Standards (VAMAS) has been established by G7 in 1982 and supports world trade in products dependent on advanced materials technologies, through International collaborative projects aimed at providing the technical basis for harmonized measurements, testing, specifications, and standards. It is composed by more than 15 Technical Working Areas devoted to the standardization and measurements of advanced materials. The participants are selected on a volunteering base and must represent at least the three international areas, Europe, Americas and East. The aim of this international interlaboratory comparison is to determine quantitatively the thermal properties of arrays of silicon nanowires measuring periodicity, diameter and height, effusivity and thermal conductance using scanning electron microscopy (SEM), atomic force microscopy (AFM) and scanning thermal microscopy (SThM). The samples are fabricated by INRiM and will be circulated among the interested partners starting from November 2024 for the SThM measurements. Data will be evaluated by CMI and INRiM and included in the VAMAS final report of the project.

Název v anglickém jazyce

Porous Silicon Nanowires: Evaluation of Thermal Properties By a Vamas Interlaboratory Comparison on Scanning Thermal Microscopy

Popis výsledku anglicky

The Versailles Project on Advanced Materials and Standards (VAMAS) has been established by G7 in 1982 and supports world trade in products dependent on advanced materials technologies, through International collaborative projects aimed at providing the technical basis for harmonized measurements, testing, specifications, and standards. It is composed by more than 15 Technical Working Areas devoted to the standardization and measurements of advanced materials. The participants are selected on a volunteering base and must represent at least the three international areas, Europe, Americas and East. The aim of this international interlaboratory comparison is to determine quantitatively the thermal properties of arrays of silicon nanowires measuring periodicity, diameter and height, effusivity and thermal conductance using scanning electron microscopy (SEM), atomic force microscopy (AFM) and scanning thermal microscopy (SThM). The samples are fabricated by INRiM and will be circulated among the interested partners starting from November 2024 for the SThM measurements. Data will be evaluated by CMI and INRiM and included in the VAMAS final report of the project.

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

21001 - Nano-materials (production and properties)

Projekt

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Návaznosti

V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů