A route to continuous ultra-thin cerium oxide films on Cu(1 1 1)

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F09%3A00206339" target="_blank" >RIV/00216208:11320/09:00206339 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

A route to continuous ultra-thin cerium oxide films on Cu(1 1 1)

Popis výsledku v původním jazyce

Cerium oxide deposited by physical vapor deposition of cerium in an oxygen atmosphere on Cu(111) surface growth epitaxially with CeO2(1 1 1) plane parallel to the Cu(111) plane. The growth and morphology of CeO2(1 1 1) films were investigated by means oflow energy electron diffraction (LEED) and scanning tunneling microscopy (STM). LEED shows good long range ordering and STM reveals a three-dimensional growth mode (Vollmer-Weber) with formation of a closed film only at larger thickness. Closed and atomically flat ceria films of larger thickness (3 ML) are obtained by applying a multistep preparation procedure, in which successive ceria layers are homoepitaxially grown on this initial film. The ceria films show similarities with the morphology of CeO2(1 1 1) single crystal surfaces, suggesting the possibility to model bulk ceria by thin film systems.

Název v anglickém jazyce

A route to continuous ultra-thin cerium oxide films on Cu(1 1 1)

Popis výsledku anglicky

Cerium oxide deposited by physical vapor deposition of cerium in an oxygen atmosphere on Cu(111) surface growth epitaxially with CeO2(1 1 1) plane parallel to the Cu(111) plane. The growth and morphology of CeO2(1 1 1) films were investigated by means oflow energy electron diffraction (LEED) and scanning tunneling microscopy (STM). LEED shows good long range ordering and STM reveals a three-dimensional growth mode (Vollmer-Weber) with formation of a closed film only at larger thickness. Closed and atomically flat ceria films of larger thickness (3 ML) are obtained by applying a multistep preparation procedure, in which successive ceria layers are homoepitaxially grown on this initial film. The ceria films show similarities with the morphology of CeO2(1 1 1) single crystal surfaces, suggesting the possibility to model bulk ceria by thin film systems.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Surface Science

ISSN

0039-6028

e-ISSN

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Svazek periodika

603

Číslo periodika v rámci svazku

23

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

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Kód UT WoS článku

000272431600009

EID výsledku v databázi Scopus

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