Elimination of Te Inclusions in Cd1-xZnxTe Crystals by Short-term Thermal Annealing

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F12%3A10127581" target="_blank" >RIV/00216208:11320/12:10127581 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1109/TNS.2012.2187069" target="_blank" >http://dx.doi.org/10.1109/TNS.2012.2187069</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/TNS.2012.2187069" target="_blank" >10.1109/TNS.2012.2187069</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Elimination of Te Inclusions in Cd1-xZnxTe Crystals by Short-term Thermal Annealing

Popis výsledku v původním jazyce

The presence of Te inclusions degrades the quality of today's CdZnTe (CZT) crystals used for X-and gamma-ray detectors; both their sizes and concentrations densities must be reduced. Over the past years, many researchers proposed using long-term annealing (>24 h) under Cd vapor pressure to reduce or even eliminate the inclusions visible under IR microscopes. We annealed detector-grade CZT samples for periods of 15 to 60 min under Cd-, Zn-, or Te-overpressure or in vacuum at 1000-1200 K. We determined the optimal temperature, duration, and the vapor atmosphere for such high-temperature annealing, typically at similar to 1100 K for 0.5-1.0 h. The results were very promising in eliminating Te-rich inclusions, even on twins where the inclusions are more stable than in the unperturbed lattice; indeed, we saw almost no inclusions whatsoever by IR transmission microscopy after such annealing. We note that eliminating inclusions at lower temperatures takes much longer. However, annealing under

Název v anglickém jazyce

Elimination of Te Inclusions in Cd1-xZnxTe Crystals by Short-term Thermal Annealing

Popis výsledku anglicky

The presence of Te inclusions degrades the quality of today's CdZnTe (CZT) crystals used for X-and gamma-ray detectors; both their sizes and concentrations densities must be reduced. Over the past years, many researchers proposed using long-term annealing (>24 h) under Cd vapor pressure to reduce or even eliminate the inclusions visible under IR microscopes. We annealed detector-grade CZT samples for periods of 15 to 60 min under Cd-, Zn-, or Te-overpressure or in vacuum at 1000-1200 K. We determined the optimal temperature, duration, and the vapor atmosphere for such high-temperature annealing, typically at similar to 1100 K for 0.5-1.0 h. The results were very promising in eliminating Te-rich inclusions, even on twins where the inclusions are more stable than in the unperturbed lattice; indeed, we saw almost no inclusions whatsoever by IR transmission microscopy after such annealing. We note that eliminating inclusions at lower temperatures takes much longer. However, annealing under

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

IEEE Transactions on Nuclear Science

ISSN

0018-9499

e-ISSN

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Svazek periodika

59

Číslo periodika v rámci svazku

2

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

256-263

Kód UT WoS článku

000302953700002

EID výsledku v databázi Scopus

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