Study of electric field distribution and low frequency noise of CdZnTe radiation detectors

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10140054" target="_blank" >RIV/00216208:11320/13:10140054 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216305:26220/13:PU103362

Výsledek na webu

<a href="http://dx.doi.org/10.1088/1748-0221/8/06/C06005" target="_blank" >http://dx.doi.org/10.1088/1748-0221/8/06/C06005</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/8/06/C06005" target="_blank" >10.1088/1748-0221/8/06/C06005</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Study of electric field distribution and low frequency noise of CdZnTe radiation detectors

Popis výsledku v původním jazyce

Polarization phenomena in a metal-semiconductor-metal (M-S-M) structure of metallic Schottky contacts deposited on CdZnTe radiation detectors were studied. We evaluate the distribution of the electric field along the biased M-S-M structure by Pockels measurements. The results show that almost all the electric field is developed across the depletion layer of the reverse-biased contact. The noise measurements of the CdZnTe detectors studied show that the dominant noise is 1/f(m) noise. The 1/f(m) noise, with the parameter m close to one, is present at frequencies below 100 Hz and its bandwidth decreases in the course of the polarization process. At higher frequencies, we observed an increase of the m parameter to 2, which indicates a strengthened effectof the generation-recombination processes. In the frequency band of dominating 1/f(m-1) noise, the increase of magnitude of the noise spectral density was proportional to the power of 6, in relation to the current through the detector. Th

Název v anglickém jazyce

Study of electric field distribution and low frequency noise of CdZnTe radiation detectors

Popis výsledku anglicky

Polarization phenomena in a metal-semiconductor-metal (M-S-M) structure of metallic Schottky contacts deposited on CdZnTe radiation detectors were studied. We evaluate the distribution of the electric field along the biased M-S-M structure by Pockels measurements. The results show that almost all the electric field is developed across the depletion layer of the reverse-biased contact. The noise measurements of the CdZnTe detectors studied show that the dominant noise is 1/f(m) noise. The 1/f(m) noise, with the parameter m close to one, is present at frequencies below 100 Hz and its bandwidth decreases in the course of the polarization process. At higher frequencies, we observed an increase of the m parameter to 2, which indicates a strengthened effectof the generation-recombination processes. In the frequency band of dominating 1/f(m-1) noise, the increase of magnitude of the noise spectral density was proportional to the power of 6, in relation to the current through the detector. Th

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Instrumentation

ISSN

1748-0221

e-ISSN

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Svazek periodika

8

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

6

Strana od-do

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Kód UT WoS článku

000321627400005

EID výsledku v databázi Scopus

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