Influence of Latent Heat on the Shape of Temperature Profile for Different Types of Solder Alloys
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F16%3A10328839" target="_blank" >RIV/00216208:11320/16:10328839 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/68407700:21230/16:00303325
Výsledek na webu
<a href="http://dx.doi.org/10.1109/ISSE.2016.7563191" target="_blank" >http://dx.doi.org/10.1109/ISSE.2016.7563191</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ISSE.2016.7563191" target="_blank" >10.1109/ISSE.2016.7563191</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Influence of Latent Heat on the Shape of Temperature Profile for Different Types of Solder Alloys
Popis výsledku v původním jazyce
Temperature profile is a very important parameter which has a high impact on reliability issues in electronic assembly manufacturing. The wrong shape of temperature profile (temperature/cooling gradients, maximum temperature, preheat together with flux activation) can lead to issues like flux/solder spattering, pad cratering, unwetting, excessive interrmetallic growth, tombstone effect shrinkage etc. This article deals with influence of latent heat on the shape of temperature profile, which starts to be more attractive due to higher integrity of electronics equipment. The experiments were based of two lead-free solder alloys (Sn96.5Ag3.5, Sn96.5Ag3Cu0.5), which were remelted on the copper pads in continual convection furnace. The temperature profile, were measured directly under the copper pads. Results shows, that the measured temperature profiles under soldering pads differs against the temperature profile which were measured on the PCB. Additionally the temperature profiles which were measured under soldering pads differ according to used solder alloys as well.
Název v anglickém jazyce
Influence of Latent Heat on the Shape of Temperature Profile for Different Types of Solder Alloys
Popis výsledku anglicky
Temperature profile is a very important parameter which has a high impact on reliability issues in electronic assembly manufacturing. The wrong shape of temperature profile (temperature/cooling gradients, maximum temperature, preheat together with flux activation) can lead to issues like flux/solder spattering, pad cratering, unwetting, excessive interrmetallic growth, tombstone effect shrinkage etc. This article deals with influence of latent heat on the shape of temperature profile, which starts to be more attractive due to higher integrity of electronics equipment. The experiments were based of two lead-free solder alloys (Sn96.5Ag3.5, Sn96.5Ag3Cu0.5), which were remelted on the copper pads in continual convection furnace. The temperature profile, were measured directly under the copper pads. Results shows, that the measured temperature profiles under soldering pads differs against the temperature profile which were measured on the PCB. Additionally the temperature profiles which were measured under soldering pads differ according to used solder alloys as well.
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
JA - Elektronika a optoelektronika, elektrotechnika
OECD FORD obor
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Návaznosti výsledku
Projekt
<a href="/cs/project/LM2011025" target="_blank" >LM2011025: LMNT - Laboratoře magnetizmu a nízkých teplot - provoz a rozvoj národní výzkumné infrastruktury</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2016
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
2016 39TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE)
ISBN
978-1-5090-1389-0
ISSN
2161-2536
e-ISSN
—
Počet stran výsledku
4
Strana od-do
214-217
Název nakladatele
IEEE
Místo vydání
NEW YORK
Místo konání akce
Pilsen
Datum konání akce
18. 5. 2016
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
000387089800042