Investigation of Nanostructures with X-ray Scattering Techniques
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F19%3A10401666" target="_blank" >RIV/00216208:11320/19:10401666 - isvavai.cz</a>
Výsledek na webu
<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=xDefaSQNXF" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=xDefaSQNXF</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/cryst9100500" target="_blank" >10.3390/cryst9100500</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Investigation of Nanostructures with X-ray Scattering Techniques
Popis výsledku v původním jazyce
The structural investigations of nanomaterials, motivated by their large variety and diverse set of applications, have attracted considerable attention. In particular, the ever-improving machinery, both in laboratory and at large-scale facilities, together with the methodical improvements available for studying nanostructures ranging from epitaxial nanomaterials, nanocrystalline thin films, and coatings, to nanoparticles and colloidal nanocrystals allows us to gain a more detailed understanding of their structural properties. As the structure essentially determines the physical properties of the materials, this advances in possibilities of structural studies also enables a deeper understanding of the structure-to-property relationships. In this special issue entitled "Investigation of Nanostructures with X-ray Scattering Techniques" five contributions show the recent progress in various research fields. Contributions cover topics as diverse as neutron scattering on magnetic multilayer films, epitaxial orientation of organic thin films, nanoparticle ordering and chemical composition analysis, and the combination of nanofocused X-ray beams with electrical measurements.
Název v anglickém jazyce
Investigation of Nanostructures with X-ray Scattering Techniques
Popis výsledku anglicky
The structural investigations of nanomaterials, motivated by their large variety and diverse set of applications, have attracted considerable attention. In particular, the ever-improving machinery, both in laboratory and at large-scale facilities, together with the methodical improvements available for studying nanostructures ranging from epitaxial nanomaterials, nanocrystalline thin films, and coatings, to nanoparticles and colloidal nanocrystals allows us to gain a more detailed understanding of their structural properties. As the structure essentially determines the physical properties of the materials, this advances in possibilities of structural studies also enables a deeper understanding of the structure-to-property relationships. In this special issue entitled "Investigation of Nanostructures with X-ray Scattering Techniques" five contributions show the recent progress in various research fields. Contributions cover topics as diverse as neutron scattering on magnetic multilayer films, epitaxial orientation of organic thin films, nanoparticle ordering and chemical composition analysis, and the combination of nanofocused X-ray beams with electrical measurements.
Klasifikace
Druh
O - Ostatní výsledky
CEP obor
—
OECD FORD obor
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Návaznosti výsledku
Projekt
<a href="/cs/project/EF15_003%2F0000485" target="_blank" >EF15_003/0000485: Centrum nanomateriálů pro pokročilé aplikace</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2019
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů