X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F01%3A00004229" target="_blank" >RIV/00216224:14310/01:00004229 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires

Popis výsledku v původním jazyce

Combined x-ray diffraction and reflectivity experiments have been performed on free-standing trapezoidal GaAs/InGaAs quantum wires using a conventional x-ray tube. Interpreting the intensity distribution around (004) by curve simulation of the extractedcoherent grating truncation rods on the basis of a semikinematical diffraction theory (DWBA) the shape and geometric parameters as well as the strain within the wires could be determined taking the results of a finite element calculation of the atomic displacements into account. The map of the coplanar x-ray reflectivity around (000), as well as the intensity profiles of the coherent grating truncation rods, located equidistantly around the specularly reflected beam, have been recorded in order to estimate the roughness properties of the sample interfaces as well as the wire shape and layer set-up without the influence of strain. All small-angle as well as wide-angle scattering experimental results went in to the mutually consistent est

Název v anglickém jazyce

X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires

Popis výsledku anglicky

Combined x-ray diffraction and reflectivity experiments have been performed on free-standing trapezoidal GaAs/InGaAs quantum wires using a conventional x-ray tube. Interpreting the intensity distribution around (004) by curve simulation of the extractedcoherent grating truncation rods on the basis of a semikinematical diffraction theory (DWBA) the shape and geometric parameters as well as the strain within the wires could be determined taking the results of a finite element calculation of the atomic displacements into account. The map of the coplanar x-ray reflectivity around (000), as well as the intensity profiles of the coherent grating truncation rods, located equidistantly around the specularly reflected beam, have been recorded in order to estimate the roughness properties of the sample interfaces as well as the wire shape and layer set-up without the influence of strain. All small-angle as well as wide-angle scattering experimental results went in to the mutually consistent est

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2001

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

J. Phys. D: Appl. Phys.

ISSN

0022-3727

e-ISSN

—

Svazek periodika

34

Číslo periodika v rámci svazku

10A

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

4

Strana od-do

"A179"

Kód UT WoS článku

—

EID výsledku v databázi Scopus

—