SPM metody v nanotechnologii

Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU50770" target="_blank" >RIV/00216305:26220/05:PU50770 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Jazyk výsledku
angličtina
Název v původním jazyce
SPM methods for nanotechnology
Popis výsledku v původním jazyce
The paper describes two methods from SPM (Scanning Probe Microscopy) family and their junction. First part is dealing with common description of STM (Scanning Tunneling Microscopy) method and its advantages and disadvantages. Two modes of TS 3130 modified STM are described. The 3D processing and its benefit for defectoscopy and SPM methods are studied. The details about SNOM (Scanning Near-field Optical Microscopy) method, its advantages and disadvantages in the local nondestructive measurement are alsso presented
Název v anglickém jazyce
SPM methods for nanotechnology
Popis výsledku anglicky
The paper describes two methods from SPM (Scanning Probe Microscopy) family and their junction. First part is dealing with common description of STM (Scanning Tunneling Microscopy) method and its advantages and disadvantages. Two modes of TS 3130 modified STM are described. The 3D processing and its benefit for defectoscopy and SPM methods are studied. The details about SNOM (Scanning Near-field Optical Microscopy) method, its advantages and disadvantages in the local nondestructive measurement are alsso presented

Rok uplatnění
2005
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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