Různé vlnové délky zdroje světle použitého v LBIC

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F06%3APU63219" target="_blank" >RIV/00216305:26220/06:PU63219 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Different Wavelenghts of light source used in LBIC

Popis výsledku v původním jazyce

The LBIC is a useful method for a non-destructive characterization of the structure of solar cells. The LBIC measurement for a solar cell local characterization has been developed and tested on mono-crystalline Si solar cells. Solar cells were locally illuminated by a focused light source of different wavelengths. The response (current or potential) of the solar cell was measured at stationary conditions during the scanning process. A large number of independent data with high spatial resolution were obtained. Applying an advanced fitting procedure on these data yields a set of local parameters for each point on the solar cell, giving information on the distribution of the photo current, series, shunt resistance and lateral diffusion of minority carriers. The theoretical approach to this technique will be discussed and the applicability of this characterization tool will be demonstrated and compared. We have studied a group of silicon solar cells with good and wrong standard parameters

Název v anglickém jazyce

Different Wavelenghts of light source used in LBIC

Popis výsledku anglicky

The LBIC is a useful method for a non-destructive characterization of the structure of solar cells. The LBIC measurement for a solar cell local characterization has been developed and tested on mono-crystalline Si solar cells. Solar cells were locally illuminated by a focused light source of different wavelengths. The response (current or potential) of the solar cell was measured at stationary conditions during the scanning process. A large number of independent data with high spatial resolution were obtained. Applying an advanced fitting procedure on these data yields a set of local parameters for each point on the solar cell, giving information on the distribution of the photo current, series, shunt resistance and lateral diffusion of minority carriers. The theoretical approach to this technique will be discussed and the applicability of this characterization tool will be demonstrated and compared. We have studied a group of silicon solar cells with good and wrong standard parameters

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GP102%2F05%2FP199" target="_blank" >GP102/05/P199: Nové metody nedestruktivního testování kvality kontaktů fotovoltaických článků</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2006

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

21st European Photovoltaic Solar Energy Conference

ISBN

3-936338-20-5

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

324-327

Název nakladatele

WIP-Renewable Energies

Místo vydání

Dresden, Germeny

Místo konání akce

Dresden

Datum konání akce

4. 9. 2006

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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