Zobrazení zadní strany solárních článků v LBIC

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU77501" target="_blank" >RIV/00216305:26220/08:PU77501 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Projection of solar cell back side contact to the LBIC image

Popis výsledku v původním jazyce

This work presents a detailed analysis of the LBIC images with visible back side contact. LBIC is the useful method to provide a non-destructive characterization of structure of solar cells. The LBIC measurement for a solar cell local characterization has been developed and tested on monocrystalline Si solar cells. Solar cells were locally illuminated by a focused light source of different wavelengths. The response (current or potential) of the solar cell was measured at stationary conditions during thescanning process. A large number of independent data with high spatial resolution were obtained. Applying an advanced fitting procedure on these data yields a set of local parameters for each point on the solar cell, giving information on the distribution of the photo current, series, shunt resistance and lateral diffusion of minority carriers. The theoretical approach to this technique will be discussed and the applicability of this characterization tool will be demonstrated and compar

Název v anglickém jazyce

Projection of solar cell back side contact to the LBIC image

Popis výsledku anglicky

This work presents a detailed analysis of the LBIC images with visible back side contact. LBIC is the useful method to provide a non-destructive characterization of structure of solar cells. The LBIC measurement for a solar cell local characterization has been developed and tested on monocrystalline Si solar cells. Solar cells were locally illuminated by a focused light source of different wavelengths. The response (current or potential) of the solar cell was measured at stationary conditions during thescanning process. A large number of independent data with high spatial resolution were obtained. Applying an advanced fitting procedure on these data yields a set of local parameters for each point on the solar cell, giving information on the distribution of the photo current, series, shunt resistance and lateral diffusion of minority carriers. The theoretical approach to this technique will be discussed and the applicability of this characterization tool will be demonstrated and compar

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

4th IWTPV'08

ISBN

978-80-01-04047-8

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

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Název nakladatele

Nakladatelství ČVUT

Místo vydání

Praha

Místo konání akce

Praha

Datum konání akce

27. 3. 2008

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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