Alternating current thin film electroluminescent device characterization

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74279" target="_blank" >RIV/00216305:26220/08:PU74279 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Alternating current thin film electroluminescent device characterization

Popis výsledku v původním jazyce

The objective of this thesis is to study the optical and electrical characterization of Alternating-Current Thin-Film ElectroLuminescent (ACTFEL) devices, and specifically the aging process of phosphor materials that comprise the ACTFEL display in an effort to improve the overall performance of the primary phosphor colors in terms of brightness, efficiency and stability. The study of the aging characteristics of evaporated and atomic layer epitaxy ZnS:Mn phosphors has been undertaken by monitoring the luminance-voltage (L-V) internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) electrical characteristics at in selected time intervals during aging. Short-term and long-term ACTFEL aging studies has been provided and an attempt to visualizelocally the structure of phosphor with a subwavelenght resolution using Scanning near-field optical microscope (SNOM) has also been presented. The practical case of a green Zn2GeO4:Mn (2% Mn) ACTFEL device operated at 50 Hz has been studi

Název v anglickém jazyce

Alternating current thin film electroluminescent device characterization

Popis výsledku anglicky

The objective of this thesis is to study the optical and electrical characterization of Alternating-Current Thin-Film ElectroLuminescent (ACTFEL) devices, and specifically the aging process of phosphor materials that comprise the ACTFEL display in an effort to improve the overall performance of the primary phosphor colors in terms of brightness, efficiency and stability. The study of the aging characteristics of evaporated and atomic layer epitaxy ZnS:Mn phosphors has been undertaken by monitoring the luminance-voltage (L-V) internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) electrical characteristics at in selected time intervals during aging. Short-term and long-term ACTFEL aging studies has been provided and an attempt to visualizelocally the structure of phosphor with a subwavelenght resolution using Scanning near-field optical microscope (SNOM) has also been presented. The practical case of a green Zn2GeO4:Mn (2% Mn) ACTFEL device operated at 50 Hz has been studi

Druh

O - Ostatní výsledky

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F08%2F1474" target="_blank" >GA102/08/1474: Lokální optická a elektrická charakterizace optoelektronických struktur s nanometrickým rozlišením</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů