Efektivní identifikace defektů ve strukturach honeycombs

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74520" target="_blank" >RIV/00216305:26220/08:PU74520 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Effective defect identifications in honeycombs

Popis výsledku v původním jazyce

The image reconstruction problem based on Electrical Impedance Tomography (EIT) is an ill-posed inverse problem of finding such conductivity distribution that minimizes some optimisation criterion, which can be given by a suitable primal objective function. This paper describes new algorithms for the reconstruction of the surface conductivity distribution, which are based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. There are shown examples of the identification of voids or cracks in special structures called honeycombs. Instead of the experimental data we used the phantom evaluated voltage values based on the application of finite element method. The results obtained by this new approach are compared with results from the known deterministic approach to the same image reconstruction.

Název v anglickém jazyce

Effective defect identifications in honeycombs

Popis výsledku anglicky

The image reconstruction problem based on Electrical Impedance Tomography (EIT) is an ill-posed inverse problem of finding such conductivity distribution that minimizes some optimisation criterion, which can be given by a suitable primal objective function. This paper describes new algorithms for the reconstruction of the surface conductivity distribution, which are based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. There are shown examples of the identification of voids or cracks in special structures called honeycombs. Instead of the experimental data we used the phantom evaluated voltage values based on the application of finite element method. The results obtained by this new approach are compared with results from the known deterministic approach to the same image reconstruction.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Advances in Electrical and Electronic Engineering

ISSN

1336-1376

e-ISSN

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Svazek periodika

08

Číslo periodika v rámci svazku

7

Stát vydavatele periodika

SK - Slovenská republika

Počet stran výsledku

406

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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