Identification of Defects in Materials with Surface Conductivity Distribution

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU73838" target="_blank" >RIV/00216305:26220/08:PU73838 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Identification of Defects in Materials with Surface Conductivity Distribution

Popis výsledku v původním jazyce

The images of the electrical surface conductivity distribution can be reconstructed from the voltage measurement captured on the boundaries of an object. This very well known technique is named Electrical Impedance Tomography. The image reconstruction problem is an ill-posed inverse problem of finding such conductivity that minimizes some optimisationcriterion, which can be given by a suitable primal objective function. This paper describes new algorithms based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. It will be shown examples of the identi?cation of voids or cracks in special structures called honeycombs. Instead of the experiments we used phantom evaluated voltage values based on the application of ?nite element method. The advantages of a new approach are compared with properties of a deterministic approach to the same image reconstructions

Název v anglickém jazyce

Identification of Defects in Materials with Surface Conductivity Distribution

Popis výsledku anglicky

The images of the electrical surface conductivity distribution can be reconstructed from the voltage measurement captured on the boundaries of an object. This very well known technique is named Electrical Impedance Tomography. The image reconstruction problem is an ill-posed inverse problem of finding such conductivity that minimizes some optimisationcriterion, which can be given by a suitable primal objective function. This paper describes new algorithms based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. It will be shown examples of the identi?cation of voids or cracks in special structures called honeycombs. Instead of the experiments we used phantom evaluated voltage values based on the application of ?nite element method. The advantages of a new approach are compared with properties of a deterministic approach to the same image reconstructions

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

PIERS ONLINE

ISSN

1931-7360

e-ISSN

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Svazek periodika

4

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

5

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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