Kombinace deterministických a stochastických metod pro rekonstrukci obrazu

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74521" target="_blank" >RIV/00216305:26220/08:PU74521 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Combination of deterministic and stochastic approaches to the image reconstruction

Popis výsledku v původním jazyce

In this paper is described a new algorithm based on the combination of deterministic and stochastic approaches to the reconstruction process of the surface conductivity distribution to obtain the best results. The images of the electrical surface conductivity distribution can be reconstructed from voltage measurement captured on the boundaries of an object. The image reconstruction problem is an ill-posed inverse problem of finding such surface conductivity that minimizes the suitable optimisation criterion. The advantages of a new approach are compared with properties of deterministic and stochastic approaches during the same image reconstructions. It will be shown that proposed algorithm is a very effective way to obtain the satisfying identificationof cracks in special structures called honeycombs.

Název v anglickém jazyce

Combination of deterministic and stochastic approaches to the image reconstruction

Popis výsledku anglicky

In this paper is described a new algorithm based on the combination of deterministic and stochastic approaches to the reconstruction process of the surface conductivity distribution to obtain the best results. The images of the electrical surface conductivity distribution can be reconstructed from voltage measurement captured on the boundaries of an object. The image reconstruction problem is an ill-posed inverse problem of finding such surface conductivity that minimizes the suitable optimisation criterion. The advantages of a new approach are compared with properties of deterministic and stochastic approaches during the same image reconstructions. It will be shown that proposed algorithm is a very effective way to obtain the satisfying identificationof cracks in special structures called honeycombs.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Advances in Electrical and Electronic Engineering

ISSN

1336-1376

e-ISSN

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Svazek periodika

08

Číslo periodika v rámci svazku

7

Stát vydavatele periodika

SK - Slovenská republika

Počet stran výsledku

406

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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