Detekce defektů v monokrystalických solárních článcích metodou LBIC, EL, FL

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU76390" target="_blank" >RIV/00216305:26220/08:PU76390 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL

Popis výsledku v původním jazyce

This work deals with analyzing various types of solar cell defects. Several diagnostic methods, such as LBIC, electroluminescence or photoluminescence, are compared. The LBIC analysis is widely used as a universal method for detecting local defects in the solar cell structure. Scanning of the solar cell surface with a single point light source (laser or LED focused beam) could take several hours of processing time depending on the required picture resolution. Electroluminescence imaging (EL) and photoluminescence (PL) are much faster methods for defects detection. In EL imaging a forward bias is applied to the finished solar cells. A higher contrast between the white and the black area is attained in consequence of uneven distribution of current density. All process steps can be scanned by a CCD camera. We would like to show compare diagnostic LBIC method with electroluminescence - preferences and deficiencies, mutual comparison.

Název v anglickém jazyce

DEFECTS DETECTION IN CRYSTALLINE SILICON SOLAR CELLS USING DIFFERENT WAVELENGTH LBIC, EL AND PL

Popis výsledku anglicky

This work deals with analyzing various types of solar cell defects. Several diagnostic methods, such as LBIC, electroluminescence or photoluminescence, are compared. The LBIC analysis is widely used as a universal method for detecting local defects in the solar cell structure. Scanning of the solar cell surface with a single point light source (laser or LED focused beam) could take several hours of processing time depending on the required picture resolution. Electroluminescence imaging (EL) and photoluminescence (PL) are much faster methods for defects detection. In EL imaging a forward bias is applied to the finished solar cells. A higher contrast between the white and the black area is attained in consequence of uneven distribution of current density. All process steps can be scanned by a CCD camera. We would like to show compare diagnostic LBIC method with electroluminescence - preferences and deficiencies, mutual comparison.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

23rd European Photovoltaic Solar Energy Conference, 1-5 September 2008, Valencia, Spain

ISBN

3-936338-24-8

ISSN

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e-ISSN

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Počet stran výsledku

3

Strana od-do

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Název nakladatele

Neuveden

Místo vydání

Neuveden

Místo konání akce

Valencie

Datum konání akce

1. 9. 2008

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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