Characterization of Si Solar Cells Imperfections in the Near-Field

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU89139" target="_blank" >RIV/00216305:26220/10:PU89139 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Characterization of Si Solar Cells Imperfections in the Near-Field

Popis výsledku v původním jazyce

This paper deals with microscale localization of solar cell imperfections. Imperfections are areas on the solar cell that emits light in visible range when the cell is reverse-biased. Samples under investigation are monocrystalline silicon solar cells. Local topography, near-field optical beam induced current, local optical properties and local visible light emission using high resolution and high sensitive techniques together with light emission thermal dependence have been measured. Generally light emission occurs in places where the near-field optical beam induced current has its local minima. The results when there is no evident correlation between light emission and near-field optical beam induced current are presented in this paper. It was foundthat one light emission macroscopic spot can consist of several small light emission spots which diameters are less than 8 ?m.

Název v anglickém jazyce

Characterization of Si Solar Cells Imperfections in the Near-Field

Popis výsledku anglicky

This paper deals with microscale localization of solar cell imperfections. Imperfections are areas on the solar cell that emits light in visible range when the cell is reverse-biased. Samples under investigation are monocrystalline silicon solar cells. Local topography, near-field optical beam induced current, local optical properties and local visible light emission using high resolution and high sensitive techniques together with light emission thermal dependence have been measured. Generally light emission occurs in places where the near-field optical beam induced current has its local minima. The results when there is no evident correlation between light emission and near-field optical beam induced current are presented in this paper. It was foundthat one light emission macroscopic spot can consist of several small light emission spots which diameters are less than 8 ?m.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GAP102%2F10%2F2013" target="_blank" >GAP102/10/2013: Fluktuační procesy v PN přechodech solárních článků</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

25th European Photovoltaic Solar Energy Conference (id 18618)

ISBN

3-936338-26-4

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

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Název nakladatele

WIP - Renewable Energies

Místo vydání

Valencia

Místo konání akce

Valencia

Datum konání akce

6. 9. 2010

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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