Leakage Current and Noise reliability indicators for Ta and NbO Low Voltage Capacitors

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU89314" target="_blank" >RIV/00216305:26220/10:PU89314 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

čeština

Název v původním jazyce

Leakage Current and Noise reliability indicators for Ta and NbO Low Voltage Capacitors

Popis výsledku v původním jazyce

An analysis of charge carrier transport and noise of low voltage Ta and NbO capacitors was performed at room and elevated temperature for MnO2 and Conducting Polymer (CP) cathode. VA characteristics and noise in normal and reverse mode in temperature range from 27 to 105 C have been measured to analyze the changes of the MIS model parameters for MnO2 and CP cathodes. During ageing at rated voltage up to temperature 50 C the leakage current and noise spectral density are constant or slightly increasing.Leakage current is for MnO2 and CP cathode at temperature 105 C for some samples increasing during a period of more than 10 days. Samples with high value of noise spectral density at room temperature revile higher current non stability. Value of noise voltage dispersion and spectral density at room temperature can be use as a quality and reliability indicator. Leakage current has two components: the first corresponds to electron transport through ideal insulator structure and the second

Název v anglickém jazyce

Leakage Current and Noise reliability indicators for Leakage Current and Noise reliability indicators for Ta and NbO Low Voltage Capacitors

Popis výsledku anglicky

An analysis of charge carrier transport and noise of low voltage Ta and NbO capacitors was performed at room and elevated temperature for MnO2 and Conducting Polymer (CP) cathode. VA characteristics and noise in normal and reverse mode in temperature range from 27 to 105 C have been measured to analyze the changes of the MIS model parameters for MnO2 and CP cathodes. During ageing at rated voltage up to temperature 50 C the leakage current and noise spectral density are constant or slightly increasing.Leakage current is for MnO2 and CP cathode at temperature 105 C for some samples increasing during a period of more than 10 days. Samples with high value of noise spectral density at room temperature revile higher current non stability. Value of noise voltage dispersion and spectral density at room temperature can be use as a quality and reliability indicator. Leakage current has two components: the first corresponds to electron transport through ideal insulator structure and the second

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F09%2F1920" target="_blank" >GA102/09/1920: Stochastické jevy v polovodičových strukturách MIS a MIM</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

CARTS USA 2010 PROCEEDINGS

ISBN

0-7908-0150-7

ISSN

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e-ISSN

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Počet stran výsledku

12

Strana od-do

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Název nakladatele

Electronic Components Association

Místo vydání

USA,New Orleans

Místo konání akce

New Orleans

Datum konání akce

15. 3. 2010

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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