LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU89315" target="_blank" >RIV/00216305:26220/10:PU89315 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs

Popis výsledku v původním jazyce

The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluationthat the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrierheights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are

Název v anglickém jazyce

LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs

Popis výsledku anglicky

The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluationthat the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrierheights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

—

Projekt

<a href="/cs/project/GA102%2F09%2F1920" target="_blank" >GA102/09/1920: Stochastické jevy v polovodičových strukturách MIS a MIM</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

CARTS USA 2010 PROCEEDINGS

ISBN

0-7908-0150-7

ISSN

—

e-ISSN

—

Počet stran výsledku

7

Strana od-do

—

Název nakladatele

Electronic Components Association

Místo vydání

USA,New Orleans

Místo konání akce

New Orleans

Datum konání akce

15. 3. 2010

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

—