Analysis of photon emision from silicon solar cells and correlation with microplasma noise

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU95464" target="_blank" >RIV/00216305:26220/11:PU95464 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Analysis of photon emision from silicon solar cells and correlation with microplasma noise

Popis výsledku v původním jazyce

Camera has been used for mapping of surface photon emission in this study CCD. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Defects are often problem because of the increasing current density and the local temperature. In addition, degradation and/or irreversible destruction go hand in hand with this phenomenon. We managed to getinformation about localized bulk spots using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists in this paper. Theresults related to several defect spots are presented in detail in this paper.

Název v anglickém jazyce

Analysis of photon emision from silicon solar cells and correlation with microplasma noise

Popis výsledku anglicky

Camera has been used for mapping of surface photon emission in this study CCD. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Defects are often problem because of the increasing current density and the local temperature. In addition, degradation and/or irreversible destruction go hand in hand with this phenomenon. We managed to getinformation about localized bulk spots using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists in this paper. Theresults related to several defect spots are presented in detail in this paper.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GAP102%2F10%2F2013" target="_blank" >GAP102/10/2013: Fluktuační procesy v PN přechodech solárních článků</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

proceedings of the 17th conference student eeict 2011 vol. 3

ISBN

978-80-214-4273-3

ISSN

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e-ISSN

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Počet stran výsledku

5

Strana od-do

417-421

Název nakladatele

Novpress

Místo vydání

Brno

Místo konání akce

Brno

Datum konání akce

28. 4. 2011

Typ akce podle státní příslušnosti

CST - Celostátní akce

Kód UT WoS článku

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