COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU99174" target="_blank" >RIV/00216305:26220/12:PU99174 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS

Popis výsledku v původním jazyce

This paper discusses the issue of silicon solar cells localized defects from metrological and physical points of view. Structure imperfections represent the real problem because of solar cells long-term degradation and conversion efficiency decreasing. To this aim we pay our attention to research relating to the defect light emission and correlation with rectangular microplasma fluctuation. A sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode, and different electric field intensity was applied. We managed to get interesting information using a combination of optical investigation and electrical noise measurement in time and spectral domain. It will be revealedthat a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper.

Název v anglickém jazyce

COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS

Popis výsledku anglicky

This paper discusses the issue of silicon solar cells localized defects from metrological and physical points of view. Structure imperfections represent the real problem because of solar cells long-term degradation and conversion efficiency decreasing. To this aim we pay our attention to research relating to the defect light emission and correlation with rectangular microplasma fluctuation. A sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode, and different electric field intensity was applied. We managed to get interesting information using a combination of optical investigation and electrical noise measurement in time and spectral domain. It will be revealedthat a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk)

ISSN

1804-3119

e-ISSN

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Svazek periodika

10

Číslo periodika v rámci svazku

2

Stát vydavatele periodika

CZ - Česká republika

Počet stran výsledku

6

Strana od-do

6-11

Kód UT WoS článku

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EID výsledku v databázi Scopus

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