Evaluation of piezoresistive ceramic pressure sensors using noise measurements

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU100136" target="_blank" >RIV/00216305:26220/12:PU100136 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Evaluation of piezoresistive ceramic pressure sensors using noise measurements

Popis výsledku v původním jazyce

The development of low-temperature co-fired ceramic (LTCC) technology is increasing the interest in ceramic pressure sensors (CPS). This technology and materials in combination with conventional thick-film technology offers a feasible solution to increase the sensitivity of pressure sensors and the flexibility in design, both with the aim to replace silicon-based pressure sensors in some applications. The sensor characteristics, i.e., offset stability and sensitivity, are always influenced by the levelof electronic noise. We are concentrating our efforts on the use of low-frequency noise as a diagnostic tool for a reliability improvement and sensitivity increase. 1/f noise is dominant in the low-frequency region. It is given by two components; one isconnected to the material structure and the second one is influenced by the defects and imperfection in the structure. The measurements of the electronic noise level could be used for an evaluation of different technologies in order to tu

Název v anglickém jazyce

Evaluation of piezoresistive ceramic pressure sensors using noise measurements

Popis výsledku anglicky

The development of low-temperature co-fired ceramic (LTCC) technology is increasing the interest in ceramic pressure sensors (CPS). This technology and materials in combination with conventional thick-film technology offers a feasible solution to increase the sensitivity of pressure sensors and the flexibility in design, both with the aim to replace silicon-based pressure sensors in some applications. The sensor characteristics, i.e., offset stability and sensitivity, are always influenced by the levelof electronic noise. We are concentrating our efforts on the use of low-frequency noise as a diagnostic tool for a reliability improvement and sensitivity increase. 1/f noise is dominant in the low-frequency region. It is given by two components; one isconnected to the material structure and the second one is influenced by the defects and imperfection in the structure. The measurements of the electronic noise level could be used for an evaluation of different technologies in order to tu

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Informacije MIDEM

ISSN

0352-9045

e-ISSN

—

Svazek periodika

42

Číslo periodika v rámci svazku

2

Stát vydavatele periodika

SI - Slovinská republika

Počet stran výsledku

6

Strana od-do

109-114

Kód UT WoS článku

—

EID výsledku v databázi Scopus

—