IONS ELECTROMIGRATION IN TANTALUM CAPACITORS

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU101138" target="_blank" >RIV/00216305:26220/12:PU101138 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

IONS ELECTROMIGRATION IN TANTALUM CAPACITORS

Popis výsledku v původním jazyce

Electromigration of mobile ions in tantalum capacitors at various temperatures and biases was investigated. An analysis of the charge carrier transport was performed to describe the leakage current (DCL) kinetics at high temperature and high electric field for MnO2 and conducting polymer (CP) cathodes. I-V characteristics in normal and reverse mode in the temperature range from 27 to 140 C have been measured. These experiments were used to determine how the capacitor MIS model parameters are changed during ageing at elevated temperature and to receive information on the DCL conduction mechanism. The leakage current changes in the high electric field and at the elevated temperature could be divided into three time intervals: (i) DCL is stable (in some samples is slightly changing) during a period up to 200 hours, (ii) DCL increases with the slope 5 to10 pA/s for time interval about 100 hours, (iii) DCL is stable or slightly increases with the slope less than 1 pA/s. The DCL values after

Název v anglickém jazyce

IONS ELECTROMIGRATION IN TANTALUM CAPACITORS

Popis výsledku anglicky

Electromigration of mobile ions in tantalum capacitors at various temperatures and biases was investigated. An analysis of the charge carrier transport was performed to describe the leakage current (DCL) kinetics at high temperature and high electric field for MnO2 and conducting polymer (CP) cathodes. I-V characteristics in normal and reverse mode in the temperature range from 27 to 140 C have been measured. These experiments were used to determine how the capacitor MIS model parameters are changed during ageing at elevated temperature and to receive information on the DCL conduction mechanism. The leakage current changes in the high electric field and at the elevated temperature could be divided into three time intervals: (i) DCL is stable (in some samples is slightly changing) during a period up to 200 hours, (ii) DCL increases with the slope 5 to10 pA/s for time interval about 100 hours, (iii) DCL is stable or slightly increases with the slope less than 1 pA/s. The DCL values after

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/EE2.3.09.0214" target="_blank" >EE2.3.09.0214: Inkubátor vědeckých týmů pro fyzikální elektroniku a nanotechnologie</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

EDS 2012 Proceedings

ISBN

978-80-214-4539-0

ISSN

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e-ISSN

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Počet stran výsledku

6

Strana od-do

343-348

Název nakladatele

IMAPS CZ&SK

Místo vydání

Neuveden

Místo konání akce

Brno

Datum konání akce

28. 6. 2012

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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