An analytical approach for scanning probe microscope-tip electrostatic field distribution accounting for dead layer and domain wall

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F13%3APU111181" target="_blank" >RIV/00216305:26220/13:PU111181 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1109/TUFFC.2013.2846" target="_blank" >http://dx.doi.org/10.1109/TUFFC.2013.2846</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/TUFFC.2013.2846" target="_blank" >10.1109/TUFFC.2013.2846</a>

Jazyk výsledku

angličtina

Název v původním jazyce

An analytical approach for scanning probe microscope-tip electrostatic field distribution accounting for dead layer and domain wall

Popis výsledku v původním jazyce

We have proposed a new theoretical approach for the determination of the electric field distribution in the ferroelectric/dielectric system with the presence of the SPM tip. The initial statement of the model has only a numerical solution. To find an analytical solution of the problem, some assumptions are introduced: the domain wall thickness can be considered to be much smaller than the domain size, and we use a high ferroelectric dielectric permittivity. The developed approach allows us to obtain explicit formulas for the polarization and electric field intensity. We have calculated and then analyzed the tip capacitance as a function of the distance from the ferroelectric interface. Additionally, different forms of the SPM tip are considered. It isdemonstrated that in the presence of charges at the domain, the results differ from those obtained with the widely used dielectric model by 30%.

Název v anglickém jazyce

An analytical approach for scanning probe microscope-tip electrostatic field distribution accounting for dead layer and domain wall

Popis výsledku anglicky

We have proposed a new theoretical approach for the determination of the electric field distribution in the ferroelectric/dielectric system with the presence of the SPM tip. The initial statement of the model has only a numerical solution. To find an analytical solution of the problem, some assumptions are introduced: the domain wall thickness can be considered to be much smaller than the domain size, and we use a high ferroelectric dielectric permittivity. The developed approach allows us to obtain explicit formulas for the polarization and electric field intensity. We have calculated and then analyzed the tip capacitance as a function of the distance from the ferroelectric interface. Additionally, different forms of the SPM tip are considered. It isdemonstrated that in the presence of charges at the domain, the results differ from those obtained with the widely used dielectric model by 30%.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BE - Teoretická fyzika

OECD FORD obor

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Projekt

<a href="/cs/project/ED2.1.00%2F03.0072" target="_blank" >ED2.1.00/03.0072: Centrum senzorických, informačních a komunikačních systémů (SIX)</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

IEEE Transactions on Ultrasonocs, Ferroelectrics, and Frequency Control

ISSN

0885-3010

e-ISSN

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Svazek periodika

60

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

2465-2470

Kód UT WoS článku

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EID výsledku v databázi Scopus

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