In-situ measurement of total ionising dose induced degradation of various commercial voltage references

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F16%3APU121383" target="_blank" >RIV/00216305:26220/16:PU121383 - isvavai.cz</a>

Výsledek na webu

<a href="https://ieeexplore.ieee.org/document/8093206" target="_blank" >https://ieeexplore.ieee.org/document/8093206</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/RADECS.2016.8093206" target="_blank" >10.1109/RADECS.2016.8093206</a>

Jazyk výsledku

angličtina

Název v původním jazyce

In-situ measurement of total ionising dose induced degradation of various commercial voltage references

Popis výsledku v původním jazyce

This work presents results of a total ionising dose experiment, during which commercial voltage references were irradiated and measured under different bias conditions using an in-situ technique. The measurement system allowed various electrical parameters of the voltage references to be measured during irradiation to 100 krad(Si) and the subsequent 50 day period of annealing. The experimental results obtained allow improved insight into total ionising dose induced degradation of data acquisition systems for space and terrestrial applications. The results show that the selected commercial voltage references can be used for high-precision data acquisition systems on board low-cost missions like CubeSats, which are typically exposed to a limited radiation dose.

Název v anglickém jazyce

In-situ measurement of total ionising dose induced degradation of various commercial voltage references

Popis výsledku anglicky

This work presents results of a total ionising dose experiment, during which commercial voltage references were irradiated and measured under different bias conditions using an in-situ technique. The measurement system allowed various electrical parameters of the voltage references to be measured during irradiation to 100 krad(Si) and the subsequent 50 day period of annealing. The experimental results obtained allow improved insight into total ionising dose induced degradation of data acquisition systems for space and terrestrial applications. The results show that the selected commercial voltage references can be used for high-precision data acquisition systems on board low-cost missions like CubeSats, which are typically exposed to a limited radiation dose.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proccedings, RADECS 2017

ISBN

9781457705854

ISSN

—

e-ISSN

—

Počet stran výsledku

4

Strana od-do

1-4

Název nakladatele

Neuveden

Místo vydání

Neuveden

Místo konání akce

Brémy, Spolková republika Německo

Datum konání akce

19. 9. 2016

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000450759400110