TID in-situ measurement of temperature coefficient of various commercial voltage references

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU124955" target="_blank" >RIV/00216305:26220/17:PU124955 - isvavai.cz</a>

Výsledek na webu

<a href="https://ieeexplore.ieee.org/document/8093206" target="_blank" >https://ieeexplore.ieee.org/document/8093206</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/RADECS.2017.8696249" target="_blank" >10.1109/RADECS.2017.8696249</a>

Jazyk výsledku

angličtina

Název v původním jazyce

TID in-situ measurement of temperature coefficient of various commercial voltage references

Popis výsledku v původním jazyce

this work presents results of a total ionising dose experiment, during which commercial voltage references were irradiated and measured under different bias conditions using an in-situ technique. The automated test system allowed the output voltage of the voltage references to be measured at various temperatures during irradiation to 100 krad(Si) and the subsequent 7 day period of annealing.The experimental results obtained allow improved insight into total ionising dose induced degradation of data acquisition systems for space applications. The results show that the temperature coefficient of selected commercial voltage references significantly changes (increases) with TID. Therefore these devices can be used for data acquisition systems only on board LEO missions like CubeSats, which are typically exposed to a limited radiation dose.

Název v anglickém jazyce

TID in-situ measurement of temperature coefficient of various commercial voltage references

Popis výsledku anglicky

this work presents results of a total ionising dose experiment, during which commercial voltage references were irradiated and measured under different bias conditions using an in-situ technique. The automated test system allowed the output voltage of the voltage references to be measured at various temperatures during irradiation to 100 krad(Si) and the subsequent 7 day period of annealing.The experimental results obtained allow improved insight into total ionising dose induced degradation of data acquisition systems for space applications. The results show that the temperature coefficient of selected commercial voltage references significantly changes (increases) with TID. Therefore these devices can be used for data acquisition systems only on board LEO missions like CubeSats, which are typically exposed to a limited radiation dose.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/LO1401" target="_blank" >LO1401: Interdisciplinární výzkum bezdrátových technologií</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Radecs 2017 proceedings

ISBN

9781509002337

ISSN

—

e-ISSN

—

Počet stran výsledku

4

Strana od-do

459-462

Název nakladatele

IEEE

Místo vydání

neuveden

Místo konání akce

Ženeva

Datum konání akce

2. 10. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000469854000089