Luminescence Diagnostics of Photovoltaic Cells

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F18%3APU128096" target="_blank" >RIV/00216305:26220/18:PU128096 - isvavai.cz</a>

Výsledek na webu

<a href="http://ijraset.com" target="_blank" >http://ijraset.com</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Luminescence Diagnostics of Photovoltaic Cells

Popis výsledku v původním jazyce

This work deals about diagnosis of photovoltaic cells by radiative recombination of electron-hole pairs. This radiative recombination is known as luminescence. Diagnostic methods using this local light emission in infrared region have innovative potential. The main area of this project research is focused on non-destructive analysis of radiated infrared radiation of monocrystalline and polycrystalline solar cells in modification of standard electroluminescence method. In this research the defects were detected at the bandgap luminescence level using a CCD camera. The spectral response of the CCD detector ranged from about 300 to 1100 nm. Method of photon emission microscopy (PEM) is used for magnification element. It is one of the modification of standard electroluminescence method. Local light emission inspection by microscopy should have benefit to qualitative evaluation of solar cells defects.

Název v anglickém jazyce

Luminescence Diagnostics of Photovoltaic Cells

Popis výsledku anglicky

This work deals about diagnosis of photovoltaic cells by radiative recombination of electron-hole pairs. This radiative recombination is known as luminescence. Diagnostic methods using this local light emission in infrared region have innovative potential. The main area of this project research is focused on non-destructive analysis of radiated infrared radiation of monocrystalline and polycrystalline solar cells in modification of standard electroluminescence method. In this research the defects were detected at the bandgap luminescence level using a CCD camera. The spectral response of the CCD detector ranged from about 300 to 1100 nm. Method of photon emission microscopy (PEM) is used for magnification element. It is one of the modification of standard electroluminescence method. Local light emission inspection by microscopy should have benefit to qualitative evaluation of solar cells defects.

Druh

J_ost - Ostatní články v recenzovaných periodicích

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

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Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

International Journal for Research in Applied Science and Engineering Technology (IJRASET)

ISSN

2321-9653

e-ISSN

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Svazek periodika

1

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

4

Strana od-do

1-4

Kód UT WoS článku

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EID výsledku v databázi Scopus

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