Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F13%3APU106327" target="_blank" >RIV/00216305:26230/13:PU106327 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Popis výsledku v původním jazyce

As the complexity of current hardware systems rises rapidly, it is a challenging task to harden these systems against faults and to complete their verification and manufacturing test. Not only that verification and testing take a considerable amount of time but the number of design errors, faults, manufacturing defects and crosstalks increases with the rising complexity as well. Furthermore, when a system is designed to be reliable new issues come into play making the picture even more complex. In this paper we performed a detailed analysis of two approaches devoted to verification of hardened systems, with respect to the test set generation: the first one is based on classical Automatic Test Pattern Generation, the second one on Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced few ideas about their combination in order to create a new promising approach for verification of reliable systems.

Název v anglickém jazyce

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Popis výsledku anglicky

As the complexity of current hardware systems rises rapidly, it is a challenging task to harden these systems against faults and to complete their verification and manufacturing test. Not only that verification and testing take a considerable amount of time but the number of design errors, faults, manufacturing defects and crosstalks increases with the rising complexity as well. Furthermore, when a system is designed to be reliable new issues come into play making the picture even more complex. In this paper we performed a detailed analysis of two approaches devoted to verification of hardened systems, with respect to the test set generation: the first one is based on classical Automatic Test Pattern Generation, the second one on Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced few ideas about their combination in order to create a new promising approach for verification of reliable systems.

Druh

D - Stať ve sborníku

CEP obor

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OECD FORD obor

10201 - Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems

ISBN

978-1-4673-6133-0

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

275-278

Název nakladatele

IEEE Computer Society

Místo vydání

Karlovy Vary

Místo konání akce

Karlovy Vary

Datum konání akce

8. 4. 2013

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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