Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F17%3APU124680" target="_blank" >RIV/00216305:26620/17:PU124680 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field

Popis výsledku v původním jazyce

Tantalum capacitors have been the preferred capacitor technology in long lifetime electronic devices thanks to the stability of its electric parameters and high reliability. However, long time application of elevated temperature and high electric field can result in capacitor leakage current increase in time. In this paper the effect of ions drift and diffusion at different temperatures on DCL degradation is analysed. DCL vs. time characteristics at temperatures from 65C to 155C were studied in order to determine the parameters of leakage current ageing. Results for four technologies are presented and it is shown that capacitor technology has crucial impact on DCL vs. time characteristics. These experiments are used to determine the background temperature at which DCL degradation starts with respect to the value of electric field. There exists background temperature under which the thermal excitation is not sufficient for give rise to the ions movement. This background temperature is higher than 105C for technology IS4 while for technology IS3 this temperature is 65C only.

Název v anglickém jazyce

Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field

Popis výsledku anglicky

Tantalum capacitors have been the preferred capacitor technology in long lifetime electronic devices thanks to the stability of its electric parameters and high reliability. However, long time application of elevated temperature and high electric field can result in capacitor leakage current increase in time. In this paper the effect of ions drift and diffusion at different temperatures on DCL degradation is analysed. DCL vs. time characteristics at temperatures from 65C to 155C were studied in order to determine the parameters of leakage current ageing. Results for four technologies are presented and it is shown that capacitor technology has crucial impact on DCL vs. time characteristics. These experiments are used to determine the background temperature at which DCL degradation starts with respect to the value of electric field. There exists background temperature under which the thermal excitation is not sufficient for give rise to the ions movement. This background temperature is higher than 105C for technology IS4 while for technology IS3 this temperature is 65C only.

Druh

D - Stať ve sborníku

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/LQ1601" target="_blank" >LQ1601: CEITEC 2020</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

PCSN 2017 Proceedings

ISBN

978-80-905768-8-9

ISSN

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e-ISSN

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Počet stran výsledku

9

Strana od-do

128-136

Název nakladatele

Ing. Vladislav Pokorný - LITERA BRNO, Tábor 43a, 612 00 Brno

Místo vydání

Česká republika

Místo konání akce

Brno

Datum konání akce

12. 9. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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