The fabrication and characterization of half-Heusler YPdBi thin films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F22%3APU142763" target="_blank" >RIV/00216305:26620/22:PU142763 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.jpcs.2021.110447" target="_blank" >https://doi.org/10.1016/j.jpcs.2021.110447</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.jpcs.2021.110447" target="_blank" >10.1016/j.jpcs.2021.110447</a>

Jazyk výsledku

angličtina

Název v původním jazyce

The fabrication and characterization of half-Heusler YPdBi thin films

Popis výsledku v původním jazyce

The electrical, optical, and magnetic properties of half-Heusler compounds make them novel interesting materials being studied by many groups worldwide. The synthesis of YPdBi, a member of half-Heusler compounds, thin films have been achieved at different deposition temperatures such as 360 degrees C and 470 degrees C by employing magnetron co-sputtering technique. X-ray diffraction (XRD) examinations have revealed that the film deposited at 360 degrees C has a slightly larger lattice parameter, 6.82 angstrom, than the film fabricated at 470 degrees C, having 6.73 angstrom. The induced strain of the films has been 2.1% and 0.7% for the films deposited at 360 degrees C and 470 degrees C, respectively. Xray photoelectron spectroscopy (XPS) investigations have revealed the obtained films have the stoichiometry close to the 1:1:1 ratio. Scanning electron microscopy (SEM) studies have shown that surface topography varies dramatically as the deposition temperature advances. Furthermore, high-resolution scanning transmission electron microscopy (STEM) has shown that layer-plus-island growth known as the Stranski-Krastanov (SK) growth mode, taking place due to minimization of strain energy, leads to the island formation from a specific film thickness on. It has been shown that while the resistance of the sample grown at 470 degrees C changes abruptly at 2.45 K, which indicates the onset of superconductivity, the sample deposited at 360 degrees C does not show this effect. The absence of the onset of superconductivity in this latter case might be associated with the lattice strain and intensive scattering in this sample.

Název v anglickém jazyce

The fabrication and characterization of half-Heusler YPdBi thin films

Popis výsledku anglicky

The electrical, optical, and magnetic properties of half-Heusler compounds make them novel interesting materials being studied by many groups worldwide. The synthesis of YPdBi, a member of half-Heusler compounds, thin films have been achieved at different deposition temperatures such as 360 degrees C and 470 degrees C by employing magnetron co-sputtering technique. X-ray diffraction (XRD) examinations have revealed that the film deposited at 360 degrees C has a slightly larger lattice parameter, 6.82 angstrom, than the film fabricated at 470 degrees C, having 6.73 angstrom. The induced strain of the films has been 2.1% and 0.7% for the films deposited at 360 degrees C and 470 degrees C, respectively. Xray photoelectron spectroscopy (XPS) investigations have revealed the obtained films have the stoichiometry close to the 1:1:1 ratio. Scanning electron microscopy (SEM) studies have shown that surface topography varies dramatically as the deposition temperature advances. Furthermore, high-resolution scanning transmission electron microscopy (STEM) has shown that layer-plus-island growth known as the Stranski-Krastanov (SK) growth mode, taking place due to minimization of strain energy, leads to the island formation from a specific film thickness on. It has been shown that while the resistance of the sample grown at 470 degrees C changes abruptly at 2.45 K, which indicates the onset of superconductivity, the sample deposited at 360 degrees C does not show this effect. The absence of the onset of superconductivity in this latter case might be associated with the lattice strain and intensive scattering in this sample.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10403 - Physical chemistry

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS

ISSN

0022-3697

e-ISSN

1879-2553

Svazek periodika

161

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

1-6

Kód UT WoS článku

000715831000009

EID výsledku v databázi Scopus

2-s2.0-85117890534