Much Ado About Nothing? Background Anomalies Without Accompanying Primary Peaks in X-Ray Photoelectron Spectroscopy and Low Energy Ion Scattering

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F26%3A0197821" target="_blank" >RIV/00216305:26620/26:0197821 - isvavai.cz</a>

Výsledek na webu

<a href="https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/sia.7378" target="_blank" >https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/sia.7378</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1002/sia.7378" target="_blank" >10.1002/sia.7378</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Much Ado About Nothing? Background Anomalies Without Accompanying Primary Peaks in X-Ray Photoelectron Spectroscopy and Low Energy Ion Scattering

Popis výsledku v původním jazyce

X-ray photoelectron spectroscopy (XPS) and low energy ion scattering (LEIS) are important methods for identifying and quantifying the elements at surfaces. XPS largely deals with zero-loss peaks produced by unattenuated photoemission, and the focus of LEIS is similarly surface peaks resulting from direct scattering from surface atoms. However, the backgrounds of these spectra also contain information. They can help reveal the structures and distributions of the atoms and layers at surfaces. Here, we show abnormalities in XPS and LEIS backgrounds that are not accompanied by zero-loss photoemission or surface peaks. These features are due to buried atoms that are far enough from the surface that they cannot produce zero loss or surface peaks but close enough to affect spectral backgrounds. This Insight Note was written to alert the reader to the existence and usefulness of these backgrounds. Spectra with background abnormalities were poorly modeled by multiple linear regression, that is, as linear combinations of the pure-material spectra. However, XPS backgrounds with anomalies can be well modeled using the QUASES software, even when zero-loss peaks are not apparent. With QUASES, it is also possible to correct the substrate spectrum for distortions caused by inelastic electron scattering. When unusual baseline features appear in XPS or LEIS spectra, it can be helpful to use a complementary technique that probes at a greater depth to confirm the presence and identity of the atoms causing the anomaly. The effects in this work were demonstrated via a lighter coating of SiO2 on a heavier stainless-steel substrate.

Název v anglickém jazyce

Much Ado About Nothing? Background Anomalies Without Accompanying Primary Peaks in X-Ray Photoelectron Spectroscopy and Low Energy Ion Scattering

Popis výsledku anglicky

X-ray photoelectron spectroscopy (XPS) and low energy ion scattering (LEIS) are important methods for identifying and quantifying the elements at surfaces. XPS largely deals with zero-loss peaks produced by unattenuated photoemission, and the focus of LEIS is similarly surface peaks resulting from direct scattering from surface atoms. However, the backgrounds of these spectra also contain information. They can help reveal the structures and distributions of the atoms and layers at surfaces. Here, we show abnormalities in XPS and LEIS backgrounds that are not accompanied by zero-loss photoemission or surface peaks. These features are due to buried atoms that are far enough from the surface that they cannot produce zero loss or surface peaks but close enough to affect spectral backgrounds. This Insight Note was written to alert the reader to the existence and usefulness of these backgrounds. Spectra with background abnormalities were poorly modeled by multiple linear regression, that is, as linear combinations of the pure-material spectra. However, XPS backgrounds with anomalies can be well modeled using the QUASES software, even when zero-loss peaks are not apparent. With QUASES, it is also possible to correct the substrate spectrum for distortions caused by inelastic electron scattering. When unusual baseline features appear in XPS or LEIS spectra, it can be helpful to use a complementary technique that probes at a greater depth to confirm the presence and identity of the atoms causing the anomaly. The effects in this work were demonstrated via a lighter coating of SiO2 on a heavier stainless-steel substrate.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

—

Návaznosti

—

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

SURFACE AND INTERFACE ANALYSIS

ISSN

0142-2421

e-ISSN

1096-9918

Svazek periodika

57

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

11

Strana od-do

264-274

Kód UT WoS článku

001405708100001

EID výsledku v databázi Scopus

2-s2.0-85216233888