AFM-in-SEM LiteScope™ Measurement modes

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F04525671%3A_____%2F23%3AN0000014" target="_blank" >RIV/04525671:_____/23:N0000014 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

AFM-in-SEM LiteScope™ Measurement modes

Popis výsledku v původním jazyce

A product data sheet is a document that contains a detailed description of a specific device and its features. The Measurement Mode Data Sheet details a wide range of measurement modes, including comprehensive sample analysis, in situ sample characterization and precise localization of the region of interest. Particular attention is paid to the unique correlation probe and electron microscopy (CPEM) technology, which allows simultaneous detection and acquisition of AFM and SEM signals, thereby achieving correlation into 3D images. The LiteScope is equipped with an advanced control system that allows various scanning probe microscopy (SPM) techniques to be performed. Available modes include AFM topography measurements, mechanical measurements such as energy dispersion, force modulation (FMM) and nanoindentation, and electrical measurements such as conductivity AFM (C-AFM), Kelvin probe microscopy (KPFM) and piezoresponse probe microscopy (PFM). In addition, spectroscopic modes such as F-curve and I-V curve measurements are also available. Important contributions to the development of this product list were the project to develop a nanoindentation module in combination with the LiteScope AFM microscope and the development and implementation of software and other data interpretation tools for correlation imaging and advanced microscopy techniques.

Název v anglickém jazyce

AFM-in-SEM LiteScope™ Measurement modes

Popis výsledku anglicky

A product data sheet is a document that contains a detailed description of a specific device and its features. The Measurement Mode Data Sheet details a wide range of measurement modes, including comprehensive sample analysis, in situ sample characterization and precise localization of the region of interest. Particular attention is paid to the unique correlation probe and electron microscopy (CPEM) technology, which allows simultaneous detection and acquisition of AFM and SEM signals, thereby achieving correlation into 3D images. The LiteScope is equipped with an advanced control system that allows various scanning probe microscopy (SPM) techniques to be performed. Available modes include AFM topography measurements, mechanical measurements such as energy dispersion, force modulation (FMM) and nanoindentation, and electrical measurements such as conductivity AFM (C-AFM), Kelvin probe microscopy (KPFM) and piezoresponse probe microscopy (PFM). In addition, spectroscopic modes such as F-curve and I-V curve measurements are also available. Important contributions to the development of this product list were the project to develop a nanoindentation module in combination with the LiteScope AFM microscope and the development and implementation of software and other data interpretation tools for correlation imaging and advanced microscopy techniques.

Druh

O - Ostatní výsledky

CEP obor

—

OECD FORD obor

21000 - Nano-technology

Projekt

<a href="/cs/project/FV40238" target="_blank" >FV40238: Pokročilé mikroskopické techniky</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2023

Kód důvěrnosti údajů

C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.