Characterization of oxygen and argon ion flux interaction with PET surfaces by in-situ XPS and ex-situ FTIR

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F44555601%3A13440%2F10%3A00005555" target="_blank" >RIV/44555601:13440/10:00005555 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Characterization of oxygen and argon ion flux interaction with PET surfaces by in-situ XPS and ex-situ FTIR

Popis výsledku v původním jazyce

The effects of low (2.5, 0.2 keV) energy reactive oxygen ion bombardment and argon ion bombardment on poly(ethylene terephthalate) thin film (PET) surface chemical composition were studied. PET films have a high potential as a material for biomedical andelectrical industries. The source of ions was an ECR Ion Gun with settable acceleration voltages. PET films were sputtered by ion bombardment for variable process time and the modified films were investigated by in-situ X-ray Photoelectron Spectroscopy(XPS) and ex-situ Fourier transform infrared spectroscopy (FTIR). The significant changes in the chemical composition of surface layers were quantitatively studied by XPS. The ion bombardment scissions the chains in PET film surface layers. Selective sputtering of oxygen atoms from PET surface was observed when argon ion flux used. The 0.2 keV and 2.5 keV argon ion decreased O/C ratio from 0.37 to 0.25, 0.04 respectively. This phenomenon is responsible for the creation of carbon-rich up

Název v anglickém jazyce

Characterization of oxygen and argon ion flux interaction with PET surfaces by in-situ XPS and ex-situ FTIR

Popis výsledku anglicky

The effects of low (2.5, 0.2 keV) energy reactive oxygen ion bombardment and argon ion bombardment on poly(ethylene terephthalate) thin film (PET) surface chemical composition were studied. PET films have a high potential as a material for biomedical andelectrical industries. The source of ions was an ECR Ion Gun with settable acceleration voltages. PET films were sputtered by ion bombardment for variable process time and the modified films were investigated by in-situ X-ray Photoelectron Spectroscopy(XPS) and ex-situ Fourier transform infrared spectroscopy (FTIR). The significant changes in the chemical composition of surface layers were quantitatively studied by XPS. The ion bombardment scissions the chains in PET film surface layers. Selective sputtering of oxygen atoms from PET surface was observed when argon ion flux used. The 0.2 keV and 2.5 keV argon ion decreased O/C ratio from 0.37 to 0.25, 0.04 respectively. This phenomenon is responsible for the creation of carbon-rich up

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

<a href="/cs/project/LC06041" target="_blank" >LC06041: Příprava, modifikace a charakterizace materiálů energetickým zářením</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Polymer degradation and stability

ISSN

0141-3910

e-ISSN

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Svazek periodika

95

Číslo periodika v rámci svazku

9

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

6

Strana od-do

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Kód UT WoS článku

000281369500044

EID výsledku v databázi Scopus

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