On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions.

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F13%3A%230002859" target="_blank" >RIV/46747885:24220/13:#0002859 - isvavai.cz</a>

Výsledek na webu

<a href="http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6645584&isnumber=6645482" target="_blank" >http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6645584&isnumber=6645482</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/FPL.2013.6645584" target="_blank" >10.1109/FPL.2013.6645584</a>

Jazyk výsledku

angličtina

Název v původním jazyce

On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions.

Popis výsledku v původním jazyce

This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq device - the programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach anda very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overviewof such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-en

Název v anglickém jazyce

On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions.

Popis výsledku anglicky

This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq device - the programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach anda very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overviewof such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-en

Druh

D - Stať ve sborníku

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

<a href="/cs/project/LD13019" target="_blank" >LD13019: SPONA - Zvýšení spolehlivosti nanoscale obvodů</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

In:23rd International Conference on Field Programmable Logic and Applications (FPL'13)

ISBN

978-1-4799-0004-6

ISSN

—

e-ISSN

—

Počet stran výsledku

4

Strana od-do

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Název nakladatele

IEEE

Místo vydání

Porto, Portugal

Místo konání akce

Porto, Portugal

Datum konání akce

1. 1. 2013

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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