A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F14%3A%230003125" target="_blank" >RIV/46747885:24220/14:#0003125 - isvavai.cz</a>

Výsledek na webu

<a href="http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=3&SID=T2NB6uw5KFzUlFqSh8f&page=1&doc=1" target="_blank" >http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=3&SID=T2NB6uw5KFzUlFqSh8f&page=1&doc=1</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.micpro.2014.04.008" target="_blank" >10.1016/j.micpro.2014.04.008</a>

Jazyk výsledku

angličtina

Název v původním jazyce

A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices

Popis výsledku v původním jazyce

This paper presents a new method and results from measurement of internal parameters of programmable nanoscale circuits, namely Xilinx FPGA devices and especially Zynq SoC devices designed on 28 nm TSMC's technology and older 45 nm Spartan 6 device as well as Xilinx Virtex product lines. The method utilizes a new undersampling approach for frequency measurement and an easy way of processing BRAM data streams. The proposed flexible circuits have been used in various measurements of timing parameters anddelays in FPGAs, including measurements or detection of the aging issues. The paper presents results of measurements under various core voltage values as performed on selected Xilinx FPGA platforms, including key results about limited usability of the latest 28 nm devices under accelerated conditions and possibility of studying or mitigating aging effects in FPGAs. The paper presents rare results of experiments, real measurements and data available from current as well as previous techno

Název v anglickém jazyce

A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices

Popis výsledku anglicky

This paper presents a new method and results from measurement of internal parameters of programmable nanoscale circuits, namely Xilinx FPGA devices and especially Zynq SoC devices designed on 28 nm TSMC's technology and older 45 nm Spartan 6 device as well as Xilinx Virtex product lines. The method utilizes a new undersampling approach for frequency measurement and an easy way of processing BRAM data streams. The proposed flexible circuits have been used in various measurements of timing parameters anddelays in FPGAs, including measurements or detection of the aging issues. The paper presents results of measurements under various core voltage values as performed on selected Xilinx FPGA platforms, including key results about limited usability of the latest 28 nm devices under accelerated conditions and possibility of studying or mitigating aging effects in FPGAs. The paper presents rare results of experiments, real measurements and data available from current as well as previous techno

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

<a href="/cs/project/LD13019" target="_blank" >LD13019: SPONA - Zvýšení spolehlivosti nanoscale obvodů</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

MICROPROCESSORS AND MICROSYSTEMS

ISSN

0141-9331

e-ISSN

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Svazek periodika

AUG 2014

Číslo periodika v rámci svazku

Volume: 38 Issue: 6

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

15

Strana od-do

605-619

Kód UT WoS článku

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EID výsledku v databázi Scopus

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