Sequential Test Decompressors with Fast Tester Bits Wide-Spreading
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F17%3A00004250" target="_blank" >RIV/46747885:24220/17:00004250 - isvavai.cz</a>
Výsledek na webu
<a href="http://www.worldscientific.com/doi/pdf/10.1142/S0218126617400011" target="_blank" >http://www.worldscientific.com/doi/pdf/10.1142/S0218126617400011</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1142/S0218126617400011" target="_blank" >10.1142/S0218126617400011</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Sequential Test Decompressors with Fast Tester Bits Wide-Spreading
Popis výsledku v původním jazyce
Usually, test pattern decompressors with dynamic reseeding are reset before starting a new test pattern decoding. The first few scan chain slices are then filled with test vectors that have lower decoding ability as the number of free variables is limited by the test access mechanism bandwidth. We have found that even within this limitation, it is possible to improve the decodability by creating fast and wide-spreading as many as possible independent linear combinations of the tester bits and using them for the scan chain loading. We evaluated features influencing the decompression quality and the hardware overhead for different decompressor principles. According to the evaluation results, we proposed a decompressor combining a XOR network and a linear feedback shift register (LFSR)-like automaton; we place the XOR network on the LFSR inputs. We demonstrate that due to this arrangement, the combined decompressor can be used without any phase shifter or state skipping ability of the LFSR. We have experimentally verified that adopting the proposed decompressor structure improves test coverage, saves the hardware resources and shortens the test application time.
Název v anglickém jazyce
Sequential Test Decompressors with Fast Tester Bits Wide-Spreading
Popis výsledku anglicky
Usually, test pattern decompressors with dynamic reseeding are reset before starting a new test pattern decoding. The first few scan chain slices are then filled with test vectors that have lower decoding ability as the number of free variables is limited by the test access mechanism bandwidth. We have found that even within this limitation, it is possible to improve the decodability by creating fast and wide-spreading as many as possible independent linear combinations of the tester bits and using them for the scan chain loading. We evaluated features influencing the decompression quality and the hardware overhead for different decompressor principles. According to the evaluation results, we proposed a decompressor combining a XOR network and a linear feedback shift register (LFSR)-like automaton; we place the XOR network on the LFSR inputs. We demonstrate that due to this arrangement, the combined decompressor can be used without any phase shifter or state skipping ability of the LFSR. We have experimentally verified that adopting the proposed decompressor structure improves test coverage, saves the hardware resources and shortens the test application time.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
20206 - Computer hardware and architecture
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2017
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS
ISSN
0218-1266
e-ISSN
—
Svazek periodika
26
Číslo periodika v rámci svazku
8
Stát vydavatele periodika
SG - Singapurská republika
Počet stran výsledku
16
Strana od-do
—
Kód UT WoS článku
000399226200002
EID výsledku v databázi Scopus
2-s2.0-85011536753