Sequential Test Decompressors with Fast Variable Wide Spreading

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F16%3A00000295" target="_blank" >RIV/46747885:24220/16:00000295 - isvavai.cz</a>

Výsledek na webu

<a href="http://ddecs2016.fiit.stuba.sk/DDECS_2016/" target="_blank" >http://ddecs2016.fiit.stuba.sk/DDECS_2016/</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/DDECS.2016.7482454" target="_blank" >10.1109/DDECS.2016.7482454</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Sequential Test Decompressors with Fast Variable Wide Spreading

Popis výsledku v původním jazyce

Usually, test pattern decompressors with dynamic reseeding are reset before starting a new test pattern decoding. The first few scan chain slices are then filled with test vectors that have lower decodability as the number of free variables is limited by the test access mechanism bandwidth. We have found that it is possible to increase the number of free variables in the equations describing the care bits encoding by fast creating and wide spreading as many as possible independent linear combinations of the tester bits and using them for the scan chain loading. We propose a decompressor combining a combinational linear decompressor and an LFSR like automaton that effectively distributes the free variables within the test pattern. The proposed test pattern decompressor outperforms the decodability of other decompressors with similar hardware overhead and it reduces the test time due to a possible reduction of the decompressor preloading.

Název v anglickém jazyce

Sequential Test Decompressors with Fast Variable Wide Spreading

Popis výsledku anglicky

Usually, test pattern decompressors with dynamic reseeding are reset before starting a new test pattern decoding. The first few scan chain slices are then filled with test vectors that have lower decodability as the number of free variables is limited by the test access mechanism bandwidth. We have found that it is possible to increase the number of free variables in the equations describing the care bits encoding by fast creating and wide spreading as many as possible independent linear combinations of the tester bits and using them for the scan chain loading. We propose a decompressor combining a combinational linear decompressor and an LFSR like automaton that effectively distributes the free variables within the test pattern. The proposed test pattern decompressor outperforms the decodability of other decompressors with similar hardware overhead and it reduces the test time due to a possible reduction of the decompressor preloading.

Druh

D - Stať ve sborníku

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

The IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems

ISBN

978-1-5090-2816-0

ISSN

—

e-ISSN

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Počet stran výsledku

6

Strana od-do

132-137

Název nakladatele

IEEE

Místo vydání

Košice, Slovakia

Místo konání akce

Košice, Slovakia

Datum konání akce

1. 1. 2016

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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