Extended binary nonlinear codes and their application in testing and compression

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F17%3A00004845" target="_blank" >RIV/46747885:24220/17:00004845 - isvavai.cz</a>

Výsledek na webu

<a href="http://ieeexplore.ieee.org/document/7968244/" target="_blank" >http://ieeexplore.ieee.org/document/7968244/</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/ETS.2017.7968244" target="_blank" >10.1109/ETS.2017.7968244</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Extended binary nonlinear codes and their application in testing and compression

Popis výsledku v původním jazyce

In this paper, we show that the binary linear codes can be extended by a relatively big number of check bits in such a way that the code words preserve the value of a maximum number of independently specified bits from the original linear code words. It can improve pattern compression and-or pseudo-exhaustive testing. Existing linear compression and testing techniques adopt linear codes either for pattern expansion in the decompressor or for pattern generation. The minimum code distance of the dual linear code determines the encoding efficiency, the greater distance causes the bigger maximum number of independently specified bits on the decompressor outputs. While keeping the number of specified bits for longer code words the extended codes provide a possibility of feeding more parallel scan chains with the decompressor output bits. In the case of pseudo-exhaustive test pattern generators, the extended nonlinear codes guarantee an existence of the universal pseudo-exhaustive test set with better parameters than can be obtained for linear test pattern generators. We compare the properties of the extended non-linear and linear codes and demonstrate the effectiveness of the decompressors using these codes.

Název v anglickém jazyce

Extended binary nonlinear codes and their application in testing and compression

Popis výsledku anglicky

In this paper, we show that the binary linear codes can be extended by a relatively big number of check bits in such a way that the code words preserve the value of a maximum number of independently specified bits from the original linear code words. It can improve pattern compression and-or pseudo-exhaustive testing. Existing linear compression and testing techniques adopt linear codes either for pattern expansion in the decompressor or for pattern generation. The minimum code distance of the dual linear code determines the encoding efficiency, the greater distance causes the bigger maximum number of independently specified bits on the decompressor outputs. While keeping the number of specified bits for longer code words the extended codes provide a possibility of feeding more parallel scan chains with the decompressor output bits. In the case of pseudo-exhaustive test pattern generators, the extended nonlinear codes guarantee an existence of the universal pseudo-exhaustive test set with better parameters than can be obtained for linear test pattern generators. We compare the properties of the extended non-linear and linear codes and demonstrate the effectiveness of the decompressors using these codes.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20206 - Computer hardware and architecture

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

2017 22ND IEEE EUROPEAN TEST SYMPOSIUM (ETS)

ISBN

978-1-5090-5457-2

ISSN

15301877

e-ISSN

—

Počet stran výsledku

2

Strana od-do

1-2

Název nakladatele

IEEE

Místo vydání

Limassol

Místo konání akce

Limassol

Datum konání akce

1. 1. 2017

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

000426966700036